Low Energy Inverse Photoemission Spectroscopy Device "LEIPS"
No damage to organic semiconductors & high resolution! LUMO level measurements can be made with precision that withstands research!
The low-energy inverse photoelectron spectroscopy device "LEIPS" is a low-energy inverse photoelectron spectroscopy apparatus that can measure LUMO levels with high precision without damaging organic semiconductors. By lowering the irradiation energy below the molecular covalent bond, it avoids damage to the sample. Additionally, it employs high-performance filters for light detection, achieving a resolution of less than 0.5 eV. Based on the conventional device "IPES," it addresses the challenges that have been encountered so far. 【Features】 ■ High sensitivity ■ High resolution of less than 0.5 eV ■ Contributes to the development and performance enhancement of organic semiconductors *For more details, please download the catalog or contact us.
basic information
【Specifications】 ■Equipment Energy resolution: 0.5 eV or less ■Electron Gun Acceleration energy: 3 to 10 eV Cathode material: BaO Beam focus: φ1 to 3 mm Sample current value: up to 10 μA Bias input: ±50 V ■Photoelectron Multiplier Tube Sensitivity wavelength: 160 nm to 650 nm Bandpass filters: 260 nm, 285 nm Window material: quartz glass ■Control Measurement control controller Display operation terminal: desktop computer OS: Windows 7 *For more details, please download the catalog or contact us.
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