Atomic Force Microscope "Handy AFM"
A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.
The atomic force microscope "Handy AFM" can be used as a substitute for high-magnification optical microscopes. It features standard measurement modes, including static force mode, dynamic force mode, phase contrast, phase measurement, force modulation, spreading resistance, and external input capabilities. The scanning head is available in two types: high-resolution and wide-area, and they can be exchanged instantly. Probe replacement takes only a few seconds, and no adjustments are needed after replacement. Additionally, carbon nanotube probes can also be approached automatically. By using an electromagnetic scanner (patented) for scanning, there is no need to move the workpiece during the scan. Generally, it does not exhibit the non-linear creep or aging changes associated with piezo devices commonly used in AFMs. Optionally, it can be combined with a compact automatic stage. For more details, please download the catalog.
basic information
【Features】 ○ Operable from a notebook PC ○ Two types of scanning heads are available: high resolution and wide area ○ Probes can be exchanged in just a few seconds ○ Carbon nanotube probes can also be auto-approached ○ Can be combined with a compact automatic stage (optional) ● For more details, please contact us or download the catalog.
Price information
Please contact us.
Delivery Time
Applications/Examples of results
【Applications】 ○ Measurement of fine line widths ○ Surface analysis of high-precision molds ○ Measurement of mask patterns ○ Evaluation of optical components ○ Evaluation of polishing and lapping ○ Observation of magnetic fields in hard disks ○ Measurement of step heights in thin films ○ Inspection of DVD pits and stampers ○ Continuous and discontinuous determination during film formation ○ Measurement of quantum dots ○ Surface inspection of films ● For more details, please contact us or download the catalog.
