Atomic Force Microscope "AFM with Stage"
The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.
The atomic force microscope "AFM with stage" is the only microscope capable of non-destructive three-dimensional measurements down to the nanometer scale in the atmosphere. It allows measurements without damaging the sample. By using an electromagnetic scanner, stable long-term measurements can be achieved without worrying about non-linear creep or aging effects. With a large stage, it is possible to perform non-destructive measurements simply by setting the sample without cutting the workpiece. Various measurement modes are available, providing functions equivalent to expensive AFM devices. Regardless of the material of the measurement work, measurements at the nano level can be performed immediately, from conductors to insulators, without any coating. For more details, please download the catalog.
basic information
【Features】 ○ Easy to move the device ○ Probe replacement is possible in just a few seconds using a quick-release mechanism, even for first-time users ○ Automatic measurement can be performed simply by inputting the desired coordinates or specifying from the MAP display ○ Two types of measurement heads are available: wide-range type and high-precision type ○ Measurement time for one scan is approximately one second ○ Side observation is possible in real-time ● For more details, please contact us or download the catalog.
Price information
Please contact us.
Delivery Time
Applications/Examples of results
【Applications】 ○ Measurement of fine line widths ○ Surface analysis of high-precision molds ○ Measurement of mask patterns ○ Evaluation of optical components ○ Evaluation of polishing and lapping ○ Inspection of DVD pits and stampers ○ Measurement of step heights in thin films ○ Measurement of quantum dots ○ Continuous and discontinuous determination during film formation ○ Surface inspection of films ○ Observation of magnetic fields in hard disks ● For more details, please contact us or download the catalog.
