Optical stopper function equipped "Sheet resistance measurement device"
Ideal for research and development of thin films for next-generation semiconductor devices. Achieves low cost.
The "Sheet Resistance Measurement Device" equipped with an optical stopper function can measure the surface resistance distribution at fine intervals (sub-micron to several tens of microns) using a micro four-terminal probe. By narrowing the functionality to applications in next-generation research and development, it achieves a low price while enabling resistance distribution measurement in fine areas of thin film surfaces in electronic devices. The optical stopper function is standardly equipped, stopping any pressing beyond a certain level even when there is no current, thus protecting the probe. For more details, please download the catalog.
basic information
【Features】 ○ Capable of measuring at fine intervals (sub-micron to several tens of microns) ○ Achieves low cost ○ Optical stopper function is standard equipment ○ Research and development of thin films for next-generation semiconductor devices (ultra-shallow junction Si wafers, organic semiconductors) ○ Research and development of functional thin films (GaN for blue diodes, SiC power devices, solar cells, etc.) ● For more details, please contact us or download the catalog.
Price information
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Applications/Examples of results
For more details, please refer to the catalog or contact us.
