Inspection device "cp-30 (microscope-type image measurement system)"
Easy operation, precise measurement, automatic measurement possible. Excellent operability in a GUI environment.
The inspection device "cp-30 (microscope-type image measurement system)" is a system that analyzes images captured by a CCD camera attached to a microscope to automatically measure line widths. It precisely measures line widths from the brightness waveform of horizontal or vertical windows set within the screen. It is linked with an XY stage through a dedicated interface, allowing it to automatically move to specified positions for width measurement. The Z-axis autofocus function enables flexible handling of workpieces with varying thicknesses. Additionally, a wafer loader and unloader can also be installed. For more details, please download the catalog.
basic information
【Features】 ○ Capable of mounting a wafer loader/unloader → Displays a wafer map form on the software, allowing for automatic measurement at each point ○ Allows for the setting of position correction marks and measurement windows to measure the length between edges of black and white brightness changes ○ Measurement patterns can be set for each image that requires measurement ○ It is also possible to measure simply by aligning two parallel lines with the mouse on the area where length measurement is desired ○ User-friendly GUI environment ● For more details, please contact us or download the catalog.
Price information
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Applications/Examples of results
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