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The inspection device "Transparent Film Inspection Certification Device" allows for direct visual observation or camera observation of patterns such as transparent films formed on transparent glass with high contrast. It generates a backlight effect that uniformly diffuses light on the surface of the glass substrate beyond the critical angle, preventing edges from glowing white when compared to dark field illumination. By incorporating coaxial reflective lighting with adjusted light intensity, it suppresses the scattering surface reflection of the transparent glass section and enhances the halation effect, increasing the reflectivity in areas without the transparent film due to the transmission effect. This makes it possible to improve the contrast by darkening the pattern of the transparent electrode under backlight. For more details, please download the catalog.

【Features】 ○ Equipped with a lighting device for microscope inspection of transparent electrodes and other components ○ Allows for direct visual or camera observation of patterns, such as transparent films formed on transparent glass, in high contrast ○ Enhances contrast by increasing halation effects, making the patterns of transparent electrodes appear darker against backlighting ○ An automatic inspection system can be easily constructed by combining with software such as IP-20 (foreign matter inspection) and CP-20 (line width measurement) ○ Can be configured with an optional line laser type follow-focus for automatic inspection machines ● For more details, please contact us or download the catalog.

Please contact us.

Please contact us.

For more details, please refer to the catalog or contact us.