Ultra-high power laser real-time measurement M2 measuring device "HAAS"

Improving the efficiency of laser processing! Numerous devices including measuring instruments, laser heads, and optical systems to prevent focal shift.

The "Laser Analysis System" from HAAS, which we handle, can measure lasers instantly and allows for real-time verification. It is easy to install and contributes to improving the efficiency and accuracy of laser processing. In addition to the analysis system, we offer a variety of products including the "Beam Transmission System," "Processing Laser Head," "TLC Optics" that prevent focal position shifts due to thermal lens effects, optical components such as mirrors and lenses, and water-cooled mounts. 【Features of Each Product in the Laser Analysis System】 ■ "Laser Beam Analyzer System BWA-CAM" ┗ Instantly measures M2. Achieves stable measurements with no moving parts. ■ "Laser Beam Profiler BA-CAM" ┗ Compact and low-cost. Three types of heads selectable by wavelength. ■ "Inline Beam Analyzer/Monitor System BWA-MON" ┗ Immediate monitoring on the processing site. Can be directly mounted on laser transmission equipment. ▼ For more details on other products, please download and view the comprehensive catalog ▼

basic information

【Other Product Features】 ■ "Laser Beam Analyzer System BWA-CAM" - Instant measurement of M2 using an etalon optical system - Capable of measuring low power up to kW class lasers - Easy setup - No moving parts, ensuring stable measurements - Standard head allows input up to 40W without attenuation ■ "Laser Beam Profiler BA-CAM" - Measurement methods comply with ISO11146 and ISO13694 - Three types of heads (200–1100nm, 1440–1605nm, 7500–13500nm) ■ "Inline Beam Analyzer Monitor System BWA-MON" - Three types of systems for low power, high power, and welding applications - Easy alignment - Rayleigh range from 50μm to 2mm - Complies with ISO standards ■ "TLC Optics" - Reduces thermal effects on optical systems from high power lasers - Uses lens materials that prevent shifts in focal position *For more details, please refer to the catalog. Feel free to contact us with any inquiries.