Film Thickness Measurement Device
A film thickness measuring device designed not only for research purposes but also for use in production environments.
The "Film Thickness Measurement Device" is a product of THETA METRISIS, handled by Outex. It is a film thickness measurement system that uses white light reflection spectroscopy, capable of measuring from the nano range to the micron range. A variety of models are available to suit different applications, ranging from convenient portable types to large stationary types. We offer numerous modules necessary for measurements in high temperatures, in liquids, microscope attachment types, gas chambers, flow cells, and more. This product is designed not only for research purposes but also with an eye towards use in production environments. 【Features】 ■ Film thickness measurement system from nano range to micron range using white light reflection spectroscopy ■ A wide selection of models available to suit various applications ■ Numerous modules available ■ Usable in both research and production environments *For more details, please refer to the PDF document or feel free to contact us.
basic information
For more details, please refer to the PDF document or feel free to contact us.
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Applications/Examples of results
【Usage】 ■ For research purposes and use in production sites *For more details, please refer to the PDF document or feel free to contact us.
