[Video] Semiconductor Process & Device Simulator "NovaTCAD"
Crosslight's TCAD integrates 2D/3D process simulators and device simulators. Free trial available!
■ A video demonstrating the automatic processing of simulations using NovaTCAD is currently available on the YouTube link below! ■ If you would like a trial version, please use the "Trial Version Application Form." (For details about the product, please refer to the product introduction materials.)
basic information
<Interface> ■Process simulation and device simulation can be controlled through a GUI (mask image editing function, physical model and bias settings, result analysis and display functions, automated processing, etc.) <Material Macro (APSYS)> ■Compounds (InGaAsNSb, AlGaAsSb, InAs, InAlAs, InP, InGaAlAs, etc.) ■Nitrides (GaN, InGaN, AlGaN, c-GaN (hexagonal), c-AlN (hexagonal), etc.) ■Silicon (poly, SiGe, h-SiC (hexagonal), a-Si (amorphous), SiO2, etc.) ■Metals (metal (general-purpose), ITO, Cu, Ag, Fe, Zn, Cd, Al, Sn, Pb, etc.) ■Insulators (air, vacuum, TiO2, AlAs-oxide, sapphire, etc.) ■Organics (BPhen, BCzVBi doped CBP, CuPc, LiF, etc.) ■Others (GaP, CdS, ZnTe, ZnSe, ZnS, etc.)
Price information
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Model number/Brand name
NovaTCAD
Applications/Examples of results
<Applicable Devices and Models> ■LDMOS ■LIGBT ■Silicon (Diodes, JFET, NPN Bipolar, TFT) ■CCD, CIS ■FDTD (2D/3D Lens, Optical Detectors) ■HBT ■HEMT, FET ■LED (GaN MQW, QDot, OLED, RCLED) ■Mixed Simulation of Devices and Circuits ■NAND Flash Memory ■NEGF (FINFET, HEMT, Nanowire, NMOS) ■QWIP ■MESFET ■RTD ■Schottky Tunneling ■Photonic Crystals ■Optical Detectors ■Solar Cells ■Tunnel Junctions ■Type II Quantum Well Optical Detectors etc. <Analysis and Plotting> ■Spatial Distribution of Physical Quantities (Potential, Carrier Density, Current Distribution, Band Diagrams, Optical Mode Distribution, Thermal Analysis, Wave Functions of Multi-Quantum Wells, etc.) ■Bias Dependence (L-I Characteristics, I-V Characteristics, Current and Gain, Current and Refractive Index Changes, etc.) ■Spectra (Mode Gain, Spontaneous Emission, Refractive Index Changes, etc.) ■AC Analysis (Frequency Characteristics, Transient Analysis, etc.)
