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Powder and Particle Analysis AI Software (AIPAS) bt-aipas-001

AI-based software for analyzing micro-particle and powder images "AIPAS"

Unlike traditional image processing based on binarization, an AI model trained on over 800,000 particles accurately detects the boundaries of the particles. Since the AI model is already equipped, users do not need to create training data or conduct training. It is software that can be immediately deployed in the field in an offline environment.

Related Link - https://www.daitron.co.jp/products/bt-aipas-001.ht…

basic information

Image loading, single image analysis, batch analysis of multiple images, comparison of analysis results, graphical display of particle size distribution, data table display of detection breakdown, calibration, ROI setting, AI model selection, custom AI model construction and implementation (for a fee), AI detection threshold adjustment, detection tuning adjustment, automatic measurement function* *Details of the automatic measurement function: Number of detections, area, maximum length, vertical ferret diameter, horizontal ferret diameter, ferret diameter ratio, aspect ratio, centroid coordinates, center coordinates, perimeter, circularity, equivalent diameter, equivalent radius, Voronoi area, Voronoi region division, distance between centroids, porosity, median diameter, standard deviation. Types of data display for detection breakdown: Number of detections, average particle size, D10, D50, D90. Recommended operating environment: OS: Windows 11 CPU: Core i7 or higher Memory: 128GB or more recommended GPU: Not particularly required (if using GPU, Nvidia RTX4090 recommended with 24GB or more memory) Capacity: SSD of 2TB or more recommended Environment: Network environment not required. *For more details, please refer to the PDF document or feel free to contact us.

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Applications/Examples of results

A module that allows for the creation of new learning models and additional training on the user side, along with other annotation assistance tools, is scheduled for release soon. Expected equipment: optical microscopes, electron microscopes, atomic force microscopes, microscopes, etc. Examples of target objects: dispersed particles, dense particles (catalysts, slurries, etc.) Device manufacturers: no dependency (manufacturer-specific formats are excluded) *For more details, please refer to the PDF document or feel free to contact us.

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