Image analysis tool 'Open eVision' *Free trial currently available
Using the normalized correlation method, it is possible to measure the deviation between the pattern and the target image and perform measurements and corrections at the sub-pixel level!
"Open eVision" is a powerful and highly flexible software tool for image processing and image analysis. The general-purpose library supports applications such as image filtering, image enhancement, blob analysis, pattern matching, arrays, and dimensional measurement. The mark inspection library includes features for optical character recognition, optical character verification, barcode reading, and data matrix code reading. 【Features】 ■ Library independent of hardware ■ Compatible with any image source, including frame grabbers, GigE Vision, and USB3 Vision cameras ■ 64-bit libraries for C++ and .NET, and 32-bit libraries for C++, .NET, and ActiveX development ■ Easy to learn and use ■ Robust, adaptable, and powerful *For more details, please refer to the PDF materials or feel free to contact us. If you wish to have a free trial, please check the catalog.
basic information
【Lineup (Excerpt)】 ■EasyImage: Image processing library ■EasyGauge: Sub-pixel measurement and dimension control library ■EasyMatch: Pattern matching library ■EasyObject: Blob analysis library ■EasyColor: Color image analysis library ■EasyFind: Geometric pattern matching library *For more details, please refer to the PDF document or feel free to contact us.
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Applications/Examples of results
【Applications】 ■ Electrical equipment industry ■ General manufacturing industry ■ Printing industry ■ Food inspection industry ■ Life sciences & healthcare *For more details, please refer to the PDF document or feel free to contact us.
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Image Sensing Exhibition 2025 Imaging Seminar Held
We will be exhibiting at the International Image Sensing Exhibition (ISS) held from June 11 (Wednesday) to June 13 (Friday). On the first day of the event, June 11 (Wednesday), we will be giving a presentation at the imaging seminar. We kindly ask you to register in advance and participate. ■ Seminar Overview - Presentation Title: Practical Examples of Utilizing Deep Learning - Date and Time: June 11, 2025 (Wednesday) 11:10 AM – 12:00 PM - Venue: Pacifico Yokohama, Special Seminar Room * Please register in advance through our website. <Recommended for> - Those who want to introduce automated inspection to reduce costs and prevent defective products from leaking. - Those who have no knowledge of image analysis but want to achieve high-quality management in a short period. 【Guest Lecture】 There will be a guest lecture by Asahara Giken Co., Ltd. in part of the session. You will have the opportunity to hear firsthand accounts from engineers tackling various challenges faced by manufacturing companies, utilizing Euresys software and frame grabbers. We encourage you to register in advance and participate.
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Invitation to Exhibit at the International Image Sensing Exhibition 2025 (ISS2025)
We will be exhibiting at the International Image Sensing Exhibition (ISS) held from June 11 (Wednesday) to June 13 (Friday). ■ Exhibition Overview Dates: June 11 (Wednesday) to June 13 (Friday), 2025, 10:00 AM to 5:00 PM Venue: Pacifico Yokohama, Exhibition Hall D, Booth 14 Official Website: https://www.adcom-media.co.jp/iss/ *Please register for attendance in advance on the website and bring the invitation ticket sent via email. ■ Exhibited Content 1. Demonstration of high-speed matching operation using a light image input board Using the Coaxlink QSFP+ light image input board, we will process images received from the camera with the image processing library EasyObject Template Matching. 2. Demonstration of high-speed left-right overlay operation using two CIS-type cameras A live demonstration will be conducted using CIS manufactured by WHEC. 3. Demonstration of a 3D measurement unit A demonstration will be conducted using a phase shift method 3D measurement unit with CoaXPress camera and frame grabber.
