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[Free Seminar] Introduction to High-Precision Cross-Sectional SEM Observation Services

ユーロフィンFQL

Cross-sectional SEM observation is an effective analytical method for visualizing internal defects that cannot be confirmed through external observation, such as cracks in through-holes and voids inside solder bumps, and is useful for identifying root causes in quality improvement and failure analysis. Our company leverages the extensive knowledge and expertise accumulated over many years of observing and analyzing electronic components to provide high-quality cross-sectional processing technology, which has received high praise from many customers. In this webinar, we will introduce various cross-sectional processing techniques we possess and actual evaluation cases utilizing these techniques. We invite you to participate as a hint for solving quality issues and improving analysis accuracy. 【Program】 　■ Cross-sectional processing methods we possess and their features 　　・Mechanical polishing 　　・CP (Cross-section polisher) 　　・FIB 　■ Actual cross-sectional evaluation cases using cross-sectional SEM 　　・Cross-sectional evaluation of DDR4 memory