Design and Construction Examples: Inline Type High and Low Temperature Testing Machine
Aging system capable of high-temperature tests, low-temperature tests, and thermal shock tests.
This is a system capable of automatic aging function testing from electronic components to finished products. It achieves inline processing from low temperatures (-40°C) to high temperatures (+125°C). Inline high and low temperature aging function testing has been realized for various applications of devices (BGA, HIC, etc.) and mounted boards. 【Benefits of System Implementation】 ○ Rapid cooling and rapid heating ○ Compatibility with diverse product lines For more details, please contact us or download the catalog.
basic information
【System Conditions】 ○ The temperature conditions for the test chamber are variable, with the low-temperature chamber ranging from (−30°C to −35°C) and the high-temperature chamber ranging from (75°C to 80°C). The temperature accuracy inside the chamber is ±1°C. → It can transport 180 workpieces in the chamber with a cycle time of 25 seconds. ○ The low-temperature chamber incorporates W coils internally, allowing for continuous operation without time loss for defrosting. ○ Both the high and low-temperature chambers adopt a vertical transport system that utilizes height. → This allows for space-saving installation (patent obtained). ○ High-speed movement from the low-temperature side to the high-temperature side enables heat shock testing. → We provide the optimal aging system according to needs. ● For more details, please contact us or download the catalog.
Price information
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Applications/Examples of results
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