Realizing extensive data retention in high-temperature AIoT applications.
[White Paper] Data Retention Methods at High Temperatures
For more details, please refer to the PDF document or feel free to contact us. As AIoT applications transition to harsher, more remote, and overall more challenging environments, data retention in NAND flash is becoming an important concern. AIoT applications in high-temperature environments are particularly susceptible to data retention issues, making it a critical problem that the industry needs to address.
basic information
Data stored in NAND flash gradually deteriorates. This deterioration is caused by the slow leakage of charge from each NAND flash cell over time. Data retention refers to the ability of flash cells to retain data. ~Please download to continue viewing~
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