The 39th NePCON Japan
日本レーザー
◀Exhibited Products▶ Non-contact Surface Roughness Measurement Device for Equipment Integration Smart Sensor (Sensofar Metrology) AR Light Guide Plate Grating Analysis System WG-GAT (OptoFidelity) Automatic Image Inspection System for AR Light Guide Plate Quality for R&D WG-IQ (OptoFidelity) High-Speed Laser Defect Scanner for Substrates AT Series (Lumina Instruments)
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Date and time Wednesday, Jan 22, 2025 ～ Friday, Jan 24, 2025
- Capital Tokyo Big Sight East Exhibition Hall Booth Number: E14-36
- Entry fee Free Pre-registration system