SEMICON Japan 2026
日本レーザー
At SEMICON Japan 2026, we will introduce measurement and inspection equipment that supports semiconductor research, development, and manufacturing. ■ Dates: December 9 (Wednesday) - 11 (Friday), 2026 ■ Venue: Tokyo Big Sight ■ Booth Number: E2708 ■ Admission: Pre-registration required ■ Planned Exhibits - Wire Grid Polarizers / Metalenses (Moxtek) - Non-contact 3D Surface Roughness Measurement Device Smart (SENSOFAR) - Laser Defect Scanner PrimaScan (Onto Innovation) - 300mm Compatible AFM-IR Vista300 (Molecular Vista) - AFM Nanoview 1000 (FSM Precision) - Conductive AFM Nano-Observer (CSInstruments) - 3D Printer for Optical Assembly Quantum X align (Nanoscribe) - Nano Positioning Stage / Displacement Sensor (attocube) - Super-resolution Optical Microscope NANORO M (LIG Nanowise) - Wafer Distortion Measurement Sensor *Under Development (Fringe Metrology) We look forward to your visit.
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Date and time Wednesday, Dec 09, 2026 ～ Friday, Dec 11, 2026
- Capital Tokyo Big Sight
- Entry fee Free