[Test, Experiment, Analysis System] Diode & Transistor Temperature Characteristic Evaluation

It is being introduced for purposes such as reducing operator workload, increasing equipment utilization rates, and data storage!

This system is designed to measure and evaluate the electrical characteristics of semiconductor products such as diodes and transistors under varying temperature and humidity conditions using a constant temperature chamber. It automates measurements and digitizes data by controlling semiconductor parameter analyzers, constant temperature chambers, and various wiring switches via GP-IB from a computer. The introduction of this system leads to improvements in operational efficiency and a reduction in workload. 【Benefits of Implementation】 ■ Improvement in Operational Efficiency - Automation increases operational efficiency (unmanned operation is possible after the test begins) - Expensive equipment can be operated more efficiently ■ Reduction in Workload - Quick automatic measurement of a series of environmental controls enables energy savings - The time products are subjected to harsh environments is minimized *For more details, please refer to the related links or feel free to contact us.

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**System Implementation Overview** **Background of Implementation** - It takes a certain amount of time to change the environment using a temperature-controlled chamber, which inevitably leads to waiting times. - The waiting time associated with environmental changes increases the temporal burden on operators, making efficient data collection quite difficult. - To improve this efficiency, it is necessary to enable programmatic control of the temperature-controlled chamber, analyzers, and switch units from a PC, allowing for the bulk setting of a series of measurement conditions and automating the process until the measurements are completed. **Purpose of Implementation** - Reducing the burden on operators - Operators should only need to wire using the switch unit and set up the software as part of the measurement preparation, then simply press the start button for the test. - After that, the program should automatically measure while switching temperature, humidity, and wiring, with results recorded as data files. - Increasing equipment utilization - We want to operate equipment (temperature-controlled chambers, semiconductor parameter analyzers, etc.) efficiently. - Data storage - We want to manage measurement data collectively for use in comparisons and other analyses. *For more details, please refer to the related links or feel free to contact us.*