Semiconductor Characterization Evaluation System
Batch processing of multiple DUTs at the package level and wafer level! Supports TDDB evaluation from individual FET transistor characteristics.
The "AMM-2000" is a semiconductor characteristic evaluation system that pursues reliability through high-precision measurement and evaluation. It plays a crucial role in identifying the causes of failure by measuring electrical characteristics and continuous changes of FET discrete transistors with high-precision voltage and current application, from package level to wafer level. The importance of reliability evaluation has dramatically increased due to the larger diameter, miniaturization, and high integration of wafers. 【Features】 ■ Batch processing of multiple DUTs at package level and wafer level ■ Achieves high-precision voltage and current application and measurement ■ Supports TDDB evaluation from FET discrete transistor characteristics ■ Soft pin assignment changes ■ Insulation breakdown measurement of FET oxide films is possible with SMU1 terminals *For more details, please download the PDF or feel free to contact us.
basic information
【Other Features】 ■ Centralized management of all tests with a single PC ■ Provision of analysis application software ■ Avoidance of electrostatic discharge at the start of testing ■ Dedicated DUT board ■ Probe card (optional) *For more details, please download the PDF or feel free to contact us.
Price range
Delivery Time
Model number/Brand name
"AMM-2000" Espec
Applications/Examples of results
For more details, please download the PDF or feel free to contact us.
