Monitored burn-in system from SoC evaluation to mass production line.
From SoC evaluation to mass production line, a suitable burn-in system solution!
The "Monitored Burn-In System" is a highly scalable burn-in system that can reduce overall testing costs by appropriately sharing ATE and test content. The user interface, inherited from numerous achievements, allows for easy creation of necessary test patterns for various memory and logic, providing high productivity. Additionally, the pattern generator, driver, and chamber are each modularized, accommodating a wide range of suitable testing environments from reliability testing to screening. 【Features】 ■ Supports a wide range of applications ■ The pattern generator can generate patterns capable of testing flash memory, various DRAMs, and logic ■ Equipped with a pin scramble function that allows for free switching of the driver's output signals *For more details, please download the PDF or feel free to contact us.
basic information
【Other Features】 ■ Signal voltage can apply two voltages, VH1 and VH2, simultaneously. ■ With the vector editor, it is possible to create a variety of test patterns such as BIST, JTAG (IEEE1449), and boundary scan. ■ The system can centrally monitor up to 8 units, allowing for total management of burn-in processes and test patterns. ■ Automation of burn-in board insertion and removal, as well as automatic sliding doors, enables labor-saving. ■ The included touch panel allows for the selection of test patterns and the setting of test conditions. *For more details, please download the PDF or feel free to contact us.
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For more details, please download the PDF or feel free to contact us.
