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Plasma cleaner

We will clean the vacuum chamber and the sample without damaging the sample and without contamination.

We will ensure the complete removal of contamination during sample observation using electron microscopes and vacuum chambers. There will be no damage or contamination to the samples. The intensity of the plasma can be monitored to automatically control parameters such as pressure.

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basic information

■Ignition of plasma at a low pressure of 0.1 mTorr. ■Plasma emission can be monitored. ■Automatic matching of RF impedance. ■Automatic control of gas flow rate is possible.

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Model number/Brand name

PIE Scientific LLC (USA)

Applications/Examples of results

Electron microscope SEM, FIB, TEM, EBL, CD-SEM, EBR, EUVL, ALD, and high-pressure chamber.

Detailed information

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