カタログ
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[Analysis Case] Degassing Evaluation of Plating Sample_C0464
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Typical materials and purpose-specific TDS analysis example_B0232
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[Analysis Case] Band Gap Evaluation of Oxidized and Nitrided Thin Films_C0462
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[Analysis Case] Evaluation of Organic Contamination of Wafers in Wafer Cases_C0461
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Analysis of Trace Metal Elements in the Environment_B0231
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[Analysis Case] Evaluation of "Water" in Quartz and Glass by SIMS_C0460
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[Analysis Case] Metal (Sn) Thermal Desorption Gas Analysis_C0458
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[Analysis Case] Structural Analysis of Tape Adhesive by GC-MS_C0459
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[Analysis Case] Qualitative Analysis of Organometallic Complexes under Atmosphere Control_C0457
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[Analysis Case] Evaluation of the Chemical State of RuO2 Catalyst by in-situ XAFS_C0456
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[Analysis Case] Evaluation of Metal Valence under Atmosphere and Temperature Control for PtRu Catalyst Used in Fuel Cells (in-situ XAFS) _C0455
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[Analysis Case] Evaluation of Carrier Density Distribution of Si-IGBT Chip_C0443
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[Analysis Case] Evaluation of Cu Surface Discoloration Using AES and SEM-EDX_C0451
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Evaluation of Organic Contamination Using a Wafer Analyzer with GC-MS_B0230
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[Analysis Case] Thermal Desorption Gas Analysis of Organic Film (TDS) _C0452
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[Analysis Case] Estimation of Detachment Components by TDS_C0453
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[Analysis Case] Qualitative and Imaging Analysis of Micro Areas by TOF-SIMS_C0449
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[Analysis Case] TOF-SIMS Analysis of Solder Peel-off Section_C0450
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[Analysis Case] Structural Analysis of Epoxy Resin_C0448
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[Analysis Case] Identification of Crystal Structure and Calculation of Composition Ratio of HfZrOx Film_C0447
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[Analysis Case] Composition Evaluation of Nozzle Surface and Inner Wall_C0446
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[Analysis Case] Visualization of the Component Distribution on the Surface of Hair Cuticles_C0438
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[Analysis Case] Evaluation of Residuals in Blood Component Washing_C0441
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[Analysis Case] Evaluation of Silicon Oxide Film by XAFS_C0439
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[Analysis Case] Analysis of Corrosive Gases Emitted from Resin_C0444
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Gas generation analysis using the heart-cut EGA method_B0228
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[Analysis Case] Evaluation of Metal Element Concentration Near the Surface of Gallium Oxide Ga2O3 Film_C0440
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![[Analysis Case] Degassing Evaluation of Plating Sample_C0464](https://image.mono.ipros.com/public/catalog/image/01/746/371296/IPROS8165821469773316950.jpg?w=120&h=170)
![[Analysis Case] Band Gap Evaluation of Oxidized and Nitrided Thin Films_C0462](https://image.mono.ipros.com/public/catalog/image/01/eba/369536/IPROS76187887167628431145.jpeg?w=120&h=170)
![[Analysis Case] Evaluation of Organic Contamination of Wafers in Wafer Cases_C0461](https://image.mono.ipros.com/public/catalog/image/01/84f/369266/IPROS2891444313489068212.jpg?w=120&h=170)
![[Analysis Case] Evaluation of "Water" in Quartz and Glass by SIMS_C0460](https://image.mono.ipros.com/public/catalog/image/01/808/367114/IPROS8988664617452252450.jpg?w=120&h=170)
![[Analysis Case] Metal (Sn) Thermal Desorption Gas Analysis_C0458](https://image.mono.ipros.com/public/catalog/image/01/de6/365856/IPROS3610509954976747836.jpg?w=120&h=170)
![[Analysis Case] Structural Analysis of Tape Adhesive by GC-MS_C0459](https://image.mono.ipros.com/public/catalog/image/01/01e/365855/IPROS99701807161807546219.jpeg?w=120&h=170)
![[Analysis Case] Qualitative Analysis of Organometallic Complexes under Atmosphere Control_C0457](https://image.mono.ipros.com/public/catalog/image/01/3f6/365462/IPROS04465483047701589452.jpeg?w=120&h=170)
![[Analysis Case] Evaluation of the Chemical State of RuO2 Catalyst by in-situ XAFS_C0456](https://image.mono.ipros.com/public/catalog/image/01/be9/364854/IPROS46526683436643387820.jpeg?w=120&h=170)
![[Analysis Case] Evaluation of Metal Valence under Atmosphere and Temperature Control for PtRu Catalyst Used in Fuel Cells (in-situ XAFS) _C0455](https://image.mono.ipros.com/public/catalog/image/01/2c3/364853/IPROS4623616378641252719.jpg?w=120&h=170)
![[Analysis Case] Micro Beer Image Analysis_C0454](https://image.mono.ipros.com/public/catalog/image/01/a95/364506/IPROS20992672786491626232.jpeg?w=120&h=170)
![[Analysis Case] Evaluation of Carrier Density Distribution of Si-IGBT Chip_C0443](https://image.mono.ipros.com/public/catalog/image/01/5cb/364339/IPROS6647405525166754641.jpg?w=120&h=170)
![[Analysis Case] Evaluation of Cu Surface Discoloration Using AES and SEM-EDX_C0451](https://image.mono.ipros.com/public/catalog/image/01/b56/364336/IPROS50152166881372698970.jpeg?w=120&h=170)
![[Analysis Case] Thermal Desorption Gas Analysis of Organic Film (TDS) _C0452](https://image.mono.ipros.com/public/catalog/image/01/dd5/364197/IPROS3050344917914986633.jpg?w=120&h=170)
![[Analysis Case] Estimation of Detachment Components by TDS_C0453](https://image.mono.ipros.com/public/catalog/image/01/aa0/364195/IPROS9215563153579198250.jpg?w=120&h=170)
![[Analysis Case] TDS Analysis of Glass Sample_C0378](https://image.mono.ipros.com/public/catalog/image/01/dd3/360909/IPROS51497307344061052947.jpeg?w=120&h=170)
![[Analysis Case] Qualitative and Imaging Analysis of Micro Areas by TOF-SIMS_C0449](https://image.mono.ipros.com/public/catalog/image/01/b38/360442/IPROS17101712566208493965.jpg?w=120&h=170)
![[Analysis Case] TOF-SIMS Analysis of Solder Peel-off Section_C0450](https://image.mono.ipros.com/public/catalog/image/01/5e7/359661/IPROS1467547451097188618.jpg?w=120&h=170)
![[Analysis Case] Structural Analysis of Epoxy Resin_C0448](https://image.mono.ipros.com/public/catalog/image/01/e70/359659/IPROS2011347876164279881.jpg?w=120&h=170)
![[Analysis Case] Identification of Crystal Structure and Calculation of Composition Ratio of HfZrOx Film_C0447](https://image.mono.ipros.com/public/catalog/image/01/1fa/359274/IPROS1613845433617815329.jpg?w=120&h=170)
![[Analysis Case] Composition Evaluation of Nozzle Surface and Inner Wall_C0446](https://image.mono.ipros.com/public/catalog/image/01/a52/358363/IPROS55392922564723771847.jpeg?w=120&h=170)
![[Analysis Case] Visualization of the Component Distribution on the Surface of Hair Cuticles_C0438](https://image.mono.ipros.com/public/catalog/image/01/b7c/357041/IPROS3428490158038115770.jpg?w=120&h=170)
![[Analysis Case] Evaluation of Residuals in Blood Component Washing_C0441](https://image.mono.ipros.com/public/catalog/image/01/bd3/357036/IPROS37742883854267911212.jpeg?w=120&h=170)
![[Analysis Case] Evaluation of Silicon Oxide Film by XAFS_C0439](https://image.mono.ipros.com/public/catalog/image/01/bb4/357029/IPROS2120569670430523854.jpg?w=120&h=170)
![[Analysis Case] Analysis of Corrosive Gases Emitted from Resin_C0444](https://image.mono.ipros.com/public/catalog/image/01/6c6/357016/IPROS4843887138918535748.jpeg?w=120&h=170)
![[Analysis Case] Evaluation of Metal Element Concentration Near the Surface of Gallium Oxide Ga2O3 Film_C0440](https://image.mono.ipros.com/public/catalog/image/01/6c0/355165/IPROS5407787901855916126.jpg?w=120&h=170)