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[Analysis Case] Depth Direction Analysis of RGB Elements in Organic EL Materials (OLED) Using TOF-SIMS A_C0243
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[Analysis Case] Composition and Thickness Evaluation of Ultra-Thin SiON Film_C0002
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[Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film_C0003
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[Analysis Case] High-Precision Analysis of Ultra-Shallow Dopant Distribution by SIMS_C0006
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[Analysis Case] Evaluation of Composition and Impurity Distribution of ZnO Films by SIMS_C0045
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[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Element Stacked Film_C0067
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[Analysis Case] Differentiation between Anatase and Rutile Types of Titanium Dioxide_C0082
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[Analysis Case] Cross-sectional Observation of Organic EL (OLED) and Gate Oxide Film using TEM and SEM_C0090
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[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices_C0094
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[Analysis Case] Observation of Crystal Structure of Multicomponent Metal Nanoparticles by TEM_C0116
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[Analysis Case] High-Sensitivity Analysis of Light Elements in Semiconductor Substrates Using SIMS_C0117
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[Analysis Case] Comprehensive Evaluation of Lithium-Ion Secondary Battery Materials_C0124
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[Analysis Case] Cross-Section Observation of Organic Thin-Film Solar Cells_C0125
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一般財団法人材料科学技術振興財団 MST
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![[Analysis Case] IGZO Thin Film Crystallinity and Film Density Evaluation_C0283](https://image.mono.ipros.com/public/catalog/image/01/bdb/265402/IPROS4276913027028575623.jpg?w=120&h=170)
![[Analysis Case] Depth Direction Analysis of RGB Elements in Organic EL Materials (OLED) Using TOF-SIMS A_C0243](https://image.mono.ipros.com/public/catalog/image/01/862/251242/IPROS96957221870969893025.jpeg?w=120&h=170)
![[Analysis Case] Composition and Thickness Evaluation of Ultra-Thin SiON Film_C0002](https://image.mono.ipros.com/public/catalog/image/01/e0d/210262/IPROS20972358062892723280.jpeg?w=120&h=170)
![[Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film_C0003](https://image.mono.ipros.com/public/catalog/image/01/375/210261/IPROS09172139836654187833.jpeg?w=120&h=170)
![[Analysis Case] Structural Analysis of Silicon Dioxide_C0004](https://image.mono.ipros.com/public/catalog/image/01/bb5/210260/IPROS60345336425792396713.jpeg?w=120&h=170)
![[Analysis Case] Structural Observation of Hall Side Wall ONO Film_C0005](https://image.mono.ipros.com/public/catalog/image_generated/01/4a0/210259/210259_IPROS6044802258772075648_1.jpg?w=120&h=170)
![[Analysis Case] High-Precision Analysis of Ultra-Shallow Dopant Distribution by SIMS_C0006](https://image.mono.ipros.com/public/catalog/image/01/006/210258/IPROS360342599862583076.jpg?w=120&h=170)
![[Analysis Case] Evaluation of Ultra-Shallow Implant Profiles by SIMS_C0009](https://image.mono.ipros.com/public/catalog/image/01/6df/210255/IPROS5042409198483037188.jpg?w=120&h=170)
![[Analysis Case] Distortion Analysis of the Element Separation Area_C0016](https://image.mono.ipros.com/public/catalog/image_generated/01/9ef/210253/210253_IPROS237008557321051771_1.jpg?w=120&h=170)
![[Analysis Case] Component Analysis of Organic EL Device_C0020](https://image.mono.ipros.com/public/catalog/image/01/2a5/210251/IPROS5145600950638822872.jpg?w=120&h=170)
![[Analysis Case] Evaluation of SiON Film by SIMS_C0029](https://image.mono.ipros.com/public/catalog/image_generated/01/5d9/210248/210248_IPROS1198877294594524690_1.jpg?w=120&h=170)
![[Analysis Case] Evaluation of Composition and Impurity Distribution of ZnO Films by SIMS_C0045](https://image.mono.ipros.com/public/catalog/image_generated/01/261/210246/210246_IPROS1488147152122073025_1.jpg?w=120&h=170)
![[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Element Stacked Film_C0067](https://image.mono.ipros.com/public/catalog/image/01/fe3/210245/IPROS04015847825460333310.jpeg?w=120&h=170)
![[Analysis Case] Contamination Assessment of Si Wafer Bevel Area_C0077](https://image.mono.ipros.com/public/catalog/image/01/513/210243/IPROS86497374366220275678.jpeg?w=120&h=170)
![[Analysis Case] Differentiation between Anatase and Rutile Types of Titanium Dioxide_C0082](https://image.mono.ipros.com/public/catalog/image_generated/01/9bd/210242/210242_IPROS2736308329397975812_1.jpg?w=120&h=170)
![[Analysis Case] Wide-Area Cross-Section Observation of Bump_C0089](https://image.mono.ipros.com/public/catalog/image_generated/01/9d1/210241/210241_IPROS107194291556634709_1.jpg?w=120&h=170)
![[Analysis Case] Cross-sectional Observation of Organic EL (OLED) and Gate Oxide Film using TEM and SEM_C0090](https://image.mono.ipros.com/public/catalog/image/01/b56/210240/IPROS91513336606251698016.jpeg?w=120&h=170)
![[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices_C0094](https://image.mono.ipros.com/public/catalog/image/01/6fc/210239/IPROS22031662456892970370.jpeg?w=120&h=170)
![[Analysis Case] Observation of Crystal Structure of Multicomponent Metal Nanoparticles by TEM_C0116](https://image.mono.ipros.com/public/catalog/image/01/b7e/210237/IPROS8347525306860253548.jpg?w=120&h=170)
![[Analysis Case] High-Sensitivity Analysis of Light Elements in Semiconductor Substrates Using SIMS_C0117](https://image.mono.ipros.com/public/catalog/image/01/279/210236/IPROS75735354622890096042.jpeg?w=120&h=170)
![[Analysis Case] Comprehensive Evaluation of Lithium-Ion Secondary Battery Materials_C0124](https://image.mono.ipros.com/public/catalog/image/01/fa3/210234/IPROS11751107456562130688.jpg?w=120&h=170)
![[Analysis Case] Cross-Section Observation of Organic Thin-Film Solar Cells_C0125](https://image.mono.ipros.com/public/catalog/image_generated/01/583/210233/210233_IPROS2191342155630336179_1.jpg?w=120&h=170)
![[Analysis Case] Evaluation of Crystal Grains in CIGS Film_C0126](https://image.mono.ipros.com/public/catalog/image_generated/01/acd/210232/210232_IPROS8481905328683601938_1.jpg?w=120&h=170)