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[Analysis Case] Crystal Structure Analysis of Polycrystals Using STEM, EBSD, and Image Simulation_C0557
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[Analysis Case] Identification of Dopant Presence Sites and Evaluation of Electronic States in Wide Bandgap Semiconductor β-Ga2O3_C0560
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[Analysis Case] Identification of Pyrolysis Products by High-Temperature XRD_C0239
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[Analysis Case] Precursor Adsorption Simulation in ALD Film Formation Using First-Principles Calculations_C0639
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[Analysis Case] Analysis of Defect Levels in Wide Bandgap Semiconductors - Gallium Nitride Using First-Principles Calculations_C0680
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Evaluation of organic substances at the metal interface causing delamination_B0285
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一般財団法人材料科学技術振興財団 MST
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