To strengthen our support system for customers in the Kansai and Western Japan areas, we will establish the MST Osaka Branch. We will provide analysis services that are more satisfactory through community-based support. 【Opening Date】 August 18, 2014 (Monday) 【Overview of Osaka Branch】 We will accept analysis consultations at your location. Please feel free to reach out to us. Through close collaboration with our headquarters lab in Setagaya, Tokyo, we will ensure quality and delivery that meet your expectations. ・Address 　532-0003 　7th Floor, Shin-Osaka Front Building, 4-1-9 Miyahara, Yodogawa-ku, Osaka City, Osaka Prefecture *Please send samples to the headquarters address in Setagaya, Tokyo. 　Headquarters Address: 1-18-6 Kitami, Setagaya, Tokyo ・Phone Number 　06-6392-2700

We would like to introduce the new analysis services that MST started from December 2013 to February 2014. MST combines a wide range of analytical methods to provide new solutions. ● Double Cs collector transmission electron microscope (TEM/STEM) [Started in February 2014] - Structural observation and elemental analysis services at atomic resolution level. ● Ultra-low acceleration scanning electron microscope (SEM) [Started in February 2014] - High-resolution observation services of nano-order surface shapes. ● Latest Auger electron spectrometer (AES) [Started in February 2014] - Elemental analysis services of the top surface with high spatial resolution. ● Scanning microwave microscope (SMM) [Started in December 2013] - Carrier concentration distribution evaluation services in semiconductor devices. For more detailed information, please visit the following URL: http://www.mst.or.jp/special/tech/tech036.html

MST is hosting a free private seminar in Osaka and Nagoya. We will introduce the latest analytical techniques based on case studies. Please make a reservation! ★Participants will receive a gift★ MST Private Seminar in Osaka and Nagoya - Introducing the Latest Analytical Techniques through Case Studies ●Osaka Venue June 19, 2013 (Wednesday) Registration starts at 12:00 PM (Seminar starts at 1:00 PM) AP Osaka Station Front, Umeda 1-chome, B2F AP Hall 2 〒530-0001 Osaka City, Kita Ward, Umeda 1-chome, 12-12 Tokyo Tatemono Umeda Building B1F・2F (Former Watanabe Recruit Building) ●Nagoya Venue June 27, 2013 (Thursday) Registration starts at 12:00 PM (Seminar starts at 1:00 PM) Wink Aichi, 10th Floor, Room 1002 〒450-0002 Aichi Prefecture, Nagoya City, Nakamura Ward, Meieki 4-chome, 4-38 ●Seminar Content - Explanation of analytical methods - Analysis and evaluation of wide-gap semiconductors - Analysis and evaluation of secondary batteries (Osaka) / Analysis and evaluation of fine devices (Nagoya) - Analysis and evaluation of solar cells (Osaka) / Analysis and evaluation of organic EL (Nagoya) - Analysis of food and cosmetics ★For detailed program information and reservations, please see the link.★

Battery Japan is an international specialized exhibition where all technologies, components, materials, and equipment necessary for the research, development, and manufacturing of secondary batteries and storage batteries come together. MST will propose solutions using analysis in the research, development, and manufacturing sites of secondary batteries. We sincerely look forward to your visit. ● Event Dates February 27 (Wednesday) to March 1 (Friday), 2013, 10:00 AM to 6:00 PM [Only on the last day, March 1 (Friday), it will end at 5:00 PM] ● Venue Tokyo Big Sight ● Exhibition Location West Hall 1, W2-30 Look for the "MST" logo as a marker. ★☆ Analysis Consultation Session! ★☆ During the event, we will offer analysis consultations at the MST booth. We will address everyday issues such as "I can't do ○○" or "I don't understand ○○." Please make use of this opportunity to solve your problems! ◆ Analysis Case Panels Installed Our analysis staff will introduce specific material analysis cases. <Main Content> ・Separator Evaluation ・Heating Degradation Test ・Evaluation of Si Negative Electrode ・Evaluation of Electrode Materials ・In-situ Crystal Evaluation of Positive Electrode LiFePO4

PV EXPO is an exhibition where components, materials, equipment, cells, and modules necessary for the research, development, and manufacturing of solar cells are showcased all in one place. At the MST booth, we will hold a seminar on solar cell analysis. We sincerely look forward to your visit. ● Dates February 27 (Wednesday) to March 1 (Friday), 2013, 10:00 AM to 6:00 PM [On the final day, March 1 (Friday), it will end at 5:00 PM] ● Venue Tokyo Big Sight ● Exhibition Location East Exhibition Hall, Hall 5 Evaluation, Measurement, and Inspection Zone, East E40-19 Look for the "MST" logo as a marker. ● Exhibition Content We will hold free seminars on the following three topics every day at the booth. Please feel free to stop by! ★ All participants in the seminars will receive a seminar booklet and MST original goods as a gift. ★ ○ We accept seat reservations ○ We anticipate that it will be crowded on the day. To ensure you can enjoy your visit comfortably, we recommend securing a seat. Please contact us with your desired lecture time and the number of reserved seats at the contact information below. Tel: 03-3749-2525 E-Mail: info@mst.or.jp

We will hold a private seminar hosted by MST. We will introduce the latest analytical techniques based on case studies. We sincerely look forward to your participation. ●Overview MST Private Seminar in Tokyo - Introducing the Latest Analytical Techniques through Case Studies ●Date and Time January 31, 2013 (Thursday) Reception starts at 12:30 (Seminar begins at 13:30), closing at 18:30 You may enter and exit freely during the seminar hours. ●Location Tokyo International Forum, 4th Floor, Room G409 3-5-1 Marunouchi, Chiyoda-ku, Tokyo 100-0005 TEL: 03-5221-9000 ●Access http://www.t-i-forum.co.jp/general/access/ ●Participation Fee Free (Pre-registration is required) ●Participation Benefits 20% off analytical service voucher Seminar text Poster session text ●Program We will hold a seminar and a poster session. ★★★★★★★★★★★★★★★★ 　　For more details, please see the link. ★★★★★★★★★★★★★★★★

For those who are breastfeeding and wish to have a radioactive substance concentration test of their breast milk, the test will be conducted. For detailed application methods and other information, please visit the website of the contact point at the link below: "Fukushima Prefecture 'Maternal and Child Health Support Project' Breast Milk Testing Services."

Alkali metals such as Li, Na, and K are key elements in various failure causes in semiconductors. These are referred to as mobile ions that can move within the film during measurement, making it difficult to obtain an accurate distribution. In this study, by conducting depth profiling analysis using a C60 (fullerene) sputter ion source in TOF-SIMS, it was found that the movement of alkali metals can be suppressed even at room temperature. This measurement allows for qualitative and quantitative analysis of impurities within SiO2 films. ★★★★★★★★★★★★★★★★★ 　Please see the link for the analysis data ★★★★★★★★★★★★★★★★★

We will be holding a private seminar hosted by MST. We will introduce the latest analytical techniques based on case studies. We sincerely look forward to your participation. ●Overview MST Private Seminar Nagoya - Introducing the Latest Analytical Techniques through Case Studies ・Date and Time August 23, 2012 (Thursday) Reception from 12:30 PM, Closing at 6:00 PM You can enter and exit freely during the seminar hours. ・Location Winc Aichi (Aichi Prefectural Industrial Labor Center) 12th Floor, Room 1201 〒450-0002 4-4-38 Meieki, Nakamura Ward, Nagoya City, Aichi Prefecture TEL: 052-571-6131 ・Access http://www.winc-aichi.jp/access/ ・Participation Fee Free (Pre-registration is required) ●Participation Benefits ・20% off analytical service coupon ・Seminar text ・Poster session text ●Program We will hold a seminar and a poster session. ★★★★★★★★★★★★★★★★ 　　For more details, please see the link ★★★★★★★★★★★★★★★★

MST has launched a service for XRD measurements at micro locations with a beam diameter of 400μm. While elemental information can be obtained for foreign substances and abnormal areas through EDX and AES analysis, adding crystallinity information through micro location XRD measurements allows for more accurate identification of foreign components. Additionally, we have established an environment to investigate the lattice constants of materials that change crystallinity with heating. MST provides a wide range of crystallinity analysis solutions to support your research and development. ★★★★★★★★★★★★★★★★★★★★ For more detailed information, please visit the link to "MST Homepage Feature: Introduction to High-Temperature XRD Analysis"! ★★★★★★★★★★★★★★★★★★★★

MST will strongly support the development of organic EL through analysis services! We have established a measurement environment to estimate the raw materials of the stacked organic films in organic EL panels, which have become more refined due to the high resolution of pixels. Through device evaluation and degradation assessment, MST will contribute to your research and development. ★★★ Analysis cases introduced this time ★★★ - Depth analysis of organic material degradation components ~ Component evaluation of organic EL degradation layers ~ - Depth analysis of polyimide components ~ Surface modification layer evaluation of organic materials is possible ~ - Depth analysis of organic EL components ~ Evaluation of organic components in micro pixel areas ~ [This is a new service!] Thanks to the new sputtering conditions of TOF-SIMS, depth analysis can now be performed without damaging organic components. - Structural estimation of organic EL materials ~ Case study of material structure estimation using Q-Tof type LC/MS/MS ~ ******************************************* For detailed data, please see the link! *******************************************

Since April 2011, MST has been actively working to improve its radiation measurement services. In this feature, we will summarize the information about the equipment we have introduced and highlight notable services. We hope that MST will be useful in enhancing your peace of mind and safety. ★Measurement Targets ★Measurement Results ★Equipment Owned ★Quality Control Initiatives ★Free Measurement of Industrial Products in Fukushima [Limited Time Only] ******************************************** 　　　For more details, please see the link. ********************************************

Interfex Japan is an international specialized exhibition where all the equipment, systems, and technologies necessary for the manufacturing and research and development of pharmaceuticals, cosmetics, and detergents are showcased together. MST will propose solutions using analysis in the research and development and manufacturing sites of pharmaceuticals and cosmetics. We sincerely look forward to your visit. ● Event Dates June 27 (Wednesday) to June 29 (Friday), 2012, 10:00 AM to 6:00 PM [Only on the final day, June 29 (Friday), it will end at 5:00 PM] ● Venue and Booth Tokyo Big Sight, East Hall 5, Booth 45-18 ● Exhibition Content We will introduce analysis case studies on panels. Specialized analysis staff will be stationed at the booth to provide consultations on analysis and introduce methods. 【Main Content】 - Evaluation of the structure and dispersion of fine particles in liquid using Cryo-SEM - Cross-sectional observation of enamel prisms in teeth using TEM - Analysis of odor components using GC/MS - Evaluation of the distribution of components in hair using TOF-SIMS - Radiation measurement We sincerely look forward to your visit.

Chitosan is used in a wide range of fields such as medicine, food, cosmetics, and clothing due to its antibacterial and moisturizing properties. Some cotton swabs, which are everyday items, are formulated with chitosan to provide antibacterial effects. Therefore, we evaluated the chitosan contained in cotton swabs using TOF-SIMS, which allows for visualization through mapping and component assessment through spectral measurement. ★★★★★★★★★★★★★★★★★ Please see the linked page for analysis data. ★★★★★★★★★★★★★★★★★

We will introduce a case where the concentration distribution of dopants in a-Si (amorphous silicon) was quantitatively evaluated in flexible thin-film Si solar cells. The sample, sealed with resin, was disassembled, and SIMS analysis was conducted. In the analysis of B (Figure 3), measurements were taken with enhanced depth resolution since it exists in shallow areas on the surface side. In the analysis of P (Figure 4), a large amount of H exists in a-Si, causing mass interference, so measurements were conducted under conditions that separated H from Si using high mass resolution methods to detect only P. ★★★★★★★★★★★★★★★★★ Please refer to the linked data for analysis results. ★★★★★★★★★★★★★★★★★

In the May 2012 issue of the monthly magazine "Applied Physics," published by the Japan Society of Applied Physics, the MST General Foundation for Materials Science and Technology contributed an article on scanning electron microscopy (SEM). ● Magazine Overview - Publisher: Japan Society of Applied Physics - Published Issue: May 2012, Applied Physics - Project Name: Basic Course <Hop, Step, Jump> Series "Scanning Electron Microscopy" ● MST Contribution Overview - Author: Kyoko Yonemitsu, Leader of the Analysis and Evaluation Department, MST General Foundation for Materials Science and Technology - Content: Applications of scanning electron microscopy in research and development - Case studies and uses Please take a look.

In SIMS analysis, it is essential to use standard samples that closely match the composition of the measurement sample in order to obtain more reliable concentration quantification values. By offering a wide range of AlGaN standard samples with varying Al content, we have been able to more accurately determine the impurity concentration in AlGaN, which is used in UV LEDs and UV sensors. We will present a case study where SIMS analysis of a UV sensor was conducted to quantify the concentration of the dopant, Si. ★★★★★★★★★★★★★★★★★ 　Please see the link for the analysis data ★★★★★★★★★★★★★★★★★

MST has previously implemented a video conferencing system between the MST Tokyo headquarters and the Nagoya branch, and now it is possible to hold video conferences between the MST Tokyo headquarters and our customers. ● System Overview Real-time meetings with the lab analysis personnel at the headquarters via video and audio, as well as instructions for measurement locations, are possible. You can have meetings with the analysis personnel at the MST Tokyo headquarters from anywhere in the country. ● Usage Notes - Customers need to prepare the video conferencing equipment at their location. - You will need to provide the IP address of your system and the manufacturer and model number of the equipment you are using. - A connection test will be conducted before the meeting. - For requests to use the service, please consult your sales representative directly or contact info@mst.or.jp.

The "Fiscal Year 2011 Regional Economic Revitalization Measures Commissioned Expense (Radiation Measurement Guidance and Advice Project)" conducted by the Tohoku Bureau of Economy, Trade and Industry from January 10, 2012 (Tuesday) to March 23, 2012 (Friday) has concluded its acceptance of applications. We sincerely thank you for the many requests we received. Moving forward, MST is considering the implementation of free radiation measurement services to support the recovery of disaster-stricken areas. Detailed information will be published on our website as soon as it is decided.

We are pleased to announce that our foundation has transitioned to a general incorporated foundation with the approval of the Prime Minister of Japan, effective April 1, 2012. Furthermore, even after the transition to a general incorporated foundation, our foundation will continue to exist with the same legal identity as stipulated by law. Therefore, all rights and obligations related to contracts of the previous foundation will be inherited by the general incorporated foundation, and we would like to inform you of this as well. For any questions or inquiries regarding this matter, please feel free to contact us through other inquiries.

Fine Tech Japan is an international business exhibition where components, materials, equipment, and the latest displays necessary for the research, development, and manufacturing of FPD (Flat Panel Displays) are showcased. MST will propose solutions using analysis in the research and development and manufacturing fields of FPD. We sincerely look forward to your visit. ● Dates April 11 (Wednesday) to April 13 (Friday), 2012, 10:00 AM to 6:00 PM [Only on the final day, April 13 (Friday), it will end at 5:00 PM] ● Venue Tokyo Big Sight ● Exhibition Location East Hall 6, Booth 41-5, marked by the "MST" logo. ● Exhibition Content Analysis Consultation Meeting During the exhibition period, we will accept analysis consultations at the MST booth. We will address everyday issues such as "I can't do ○○" or "I don't understand ○○." Please make use of our services to help solve your problems! ★ A panel of analysis case studies will be set up Our analysis staff will introduce specific material analysis case studies. Main Content - Analysis case studies under controlled atmospheres for organic EL materials ● Application for Exhibition Invitation Tickets Please contact us at info@mst.or.jp with the number of tickets you would like.

In the March 2012 issue of the magazine "Electronic Journal" published by the Electronic Journal Co., Ltd., the MST (Materials Science and Technology Promotion Foundation) contributed an article about failure analysis and contract analysis services. ● Magazine Overview Publisher: Electronic Journal Co., Ltd. Publication Date: March 15, 2012 Electronic Journal March 2012 Issue - Special Feature on Failure Analysis and Analysis Outsourcing ● MST Contribution Overview Author: Tatsuhiro Sasaki, Leader of the Analysis and Evaluation Department, MST (Materials Science and Technology Promotion Foundation) Content: MST's failure analysis and contract analysis services Providing rapid and high-precision analysis. Also addressing the evaluation needs of new materials. Please take a look!

PV EXPO 2012 is an international specialized exhibition where all technologies, components, materials, and equipment necessary for the research, development, and manufacturing of solar cells/photovoltaic systems come together. MST will propose solutions using analysis in the research and development and manufacturing fields of secondary batteries. We sincerely look forward to your visit. ● Dates February 29 (Wednesday) to March 2 (Friday), 2012, 10:00 AM to 6:00 PM [Only on the last day, March 2 (Friday), it will end at 5:00 PM] ● Venue Tokyo Big Sight ● Exhibition Location East Hall 5, E34-001 ● Free Seminar on Solar Cell Analysis! We will hold a free seminar focusing on the analysis of the currently popular CIGS, organic thin-film, and crystalline silicon solar cells. ****************************** For more details, please refer to the related product information "Free Seminar on Solar Cell Analysis [Text Gift Available]!" ******************************

The application for the 12th Sadakazu Yamazaki Award has started. For more details, please visit the Sadakazu Yamazaki Award website and see "Application for Candidates for the 12th Sadakazu Yamazaki Award Now Open."

"Unlike usual, there is a strange odor." "I want to know the components of the exhaust gases from the engine and pump." By identifying the source of the strange odor and determining its components, we can take measures smoothly. Moreover, as environmental issues gain attention, it is increasingly required to accurately understand what is actually emitted as exhaust gases from the equipment being used. This time, we will introduce our MST analysis service lineup using GC/MS to address the challenges of components in the atmosphere. **************************************** For more details, please visit the MST homepage and check out the special feature on environmental (atmospheric and odor) analysis!! ****************************************

The seminar "Hitachi Materials Analysis Seminar 2012 (Nagoya)" hosted by Hitachi High-Technologies Corporation will feature a lecturer from the MST (Foundation for the Promotion of Material Science and Technology). The analysis of lithium-ion secondary batteries will be reviewed based on analytical data. We look forward to your participation. ● Date and Venue February 3, 2012 (Friday) 13:00 - 17:40 17th Floor, Takisada Building, Nagoya City, Aichi Prefecture ● Participation Fee and Registration For more details, please visit the Hitachi High-Technologies website. ● Overview of the MST Lecturer's Course - Title Cryo FIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Batteries - Lecturer TMG Eguchi, Analysis and Evaluation Department, Foundation for the Promotion of Material Science and Technology

To enhance support for our customers in the Tokai and Kansai regions, we have expanded the staff and facilities at the MST Nagoya branch. *There is no change in location. ● Equipped with a video conferencing system We have installed a video conferencing system between the Nagoya branch and our headquarters lab in Setagaya, Tokyo. This allows for real-time meetings with the analysis personnel at the headquarters lab via video and audio, as well as instructions for measurement locations. We aim to provide faster and more accurate analysis services. Customers are also welcome to visit the Nagoya branch for consultations. Please feel free to contact us. ● Overview of the Nagoya Branch We accept analysis consultations at your location. Please feel free to reach out to us. Through close collaboration with our headquarters lab in Setagaya, Tokyo, we ensure satisfactory quality and delivery times. - Address 3rd Floor, EME Nagoya Building, 4-24-8 Meieki, Nakamura Ward, Nagoya City, Aichi Prefecture *Please send samples to our headquarters in Setagaya, Tokyo. - Phone Number 052-586-2626

Our organization, commissioned by the Tohoku Bureau of Economy, Trade and Industry, will provide the following services free of charge in response to requests from companies (excluding individuals) centered in Fukushima Prefecture. ● Service Types - On-site radiation measurement guidance and advice service - Radiation measurement guidance and advice service with measurement samples brought in - Measurement equipment lending service ● Measurement Location Fukushima High-Tech Plaza, Fukushima Technology Support Center Reception: 2nd floor of the main building "Technical Research Room," Measurement: Experimental building "Heat Treatment Testing Room" 〒960-2154 Fukushima Prefecture, Fukushima City, Sakurashimo, Tsukino River 1-3 ● Parking Parking spaces available. ● Reception Period From January 10, 2012 (Tuesday) to March 23, 2012 (Friday) Every Monday to Friday, 9:00 AM to 12:00 PM and 1:00 PM to 5:00 PM (Excluding holidays) ● Advance Reservation Required ● Contact Information Fukushima Radiation Measurement Room, Materials Science and Technology Promotion Foundation TEL. 090-3470-6954 or 090-3470-7760 ******************************* For more detailed information, please check the link. *******************************

Dear Customers, Thank you very much for your continued support of the Materials Science and Technology Promotion Foundation. We would like to inform you that our foundation will be closed for the year-end and New Year holidays from December 29 (Thursday) to January 4 (Wednesday). We apologize for any inconvenience this may cause to our users and appreciate your understanding.

On November 18, 2011 (Friday), the 11th Yamazaki Teiichi Award presentation ceremony was held at the Japan Academy (Taito Ward, Tokyo). For information about the award recipients, please see the link for the 11th (2011 fiscal year) Yamazaki Teiichi Award recipients.