We have published the following two analysis case studies on the MST website: - Evaluation of organic EL devices using MSDM (Mass Spectra Depth Mapping) (C0411) - Evaluation of high electron mobility transistors (C0410) For more details, please visit the MST website. http://www.mst.or.jp/

We have published two analysis case studies on the MST website. - Qualitative analysis of powder contaminants (C0408) - Polarity evaluation of GaN through ABF-STEM observation (C0409) For more details, please visit the MST website. http://www.mst.or.jp/

We have published the following three analysis case studies on the MST website: - Evaluation of additives for polymer materials using the dissolution-reprecipitation method (C0407) - Evaluation of additives for polymer materials (C0406) - Differences in detected components using ionization methods ESI and APCI (B0220) For more details, please visit the MST website. http://www.mst.or.jp/

The analysis case "Evaluation of Nickel Plating Peel-off Surface (C0404)" has been published on the MST website. For more details, please visit the MST website. http://www.mst.or.jp/

The analysis case "Gas Analysis of SiN Film by TDS (C0403)" has been published on the MST website. For more details, please visit the MST website. http://www.mst.or.jp/

We have published a case study on sample setting for TDS (B0219) on the MST website. For more details, please visit the MST website. http://www.mst.or.jp/

Alkali metals such as Li, Na, and K are key elements in various failure causes in semiconductors. These are referred to as mobile ions that can move within the film during measurement, making it difficult to obtain an accurate distribution. In this study, by conducting depth profiling analysis using a C60 (fullerene) sputter ion source in TOF-SIMS, it was found that the movement of alkali metals can be suppressed even at room temperature. This measurement allows for qualitative and quantitative analysis of impurities within SiO2 films. ★★★★★★★★★★★★★★★★★ 　Please see the link for the analysis data ★★★★★★★★★★★★★★★★★

Chitosan is used in a wide range of fields such as medicine, food, cosmetics, and clothing due to its antibacterial and moisturizing properties. Some cotton swabs, which are everyday items, are formulated with chitosan to provide antibacterial effects. Therefore, we evaluated the chitosan contained in cotton swabs using TOF-SIMS, which allows for visualization through mapping and component assessment through spectral measurement. ★★★★★★★★★★★★★★★★★ Please see the linked page for analysis data. ★★★★★★★★★★★★★★★★★

We will introduce a case where the concentration distribution of dopants in a-Si (amorphous silicon) was quantitatively evaluated in flexible thin-film Si solar cells. The sample, sealed with resin, was disassembled, and SIMS analysis was conducted. In the analysis of B (Figure 3), measurements were taken with enhanced depth resolution since it exists in shallow areas on the surface side. In the analysis of P (Figure 4), a large amount of H exists in a-Si, causing mass interference, so measurements were conducted under conditions that separated H from Si using high mass resolution methods to detect only P. ★★★★★★★★★★★★★★★★★ Please refer to the linked data for analysis results. ★★★★★★★★★★★★★★★★★

In SIMS analysis, it is essential to use standard samples that closely match the composition of the measurement sample in order to obtain more reliable concentration quantification values. By offering a wide range of AlGaN standard samples with varying Al content, we have been able to more accurately determine the impurity concentration in AlGaN, which is used in UV LEDs and UV sensors. We will present a case study where SIMS analysis of a UV sensor was conducted to quantify the concentration of the dopant, Si. ★★★★★★★★★★★★★★★★★ 　Please see the link for the analysis data ★★★★★★★★★★★★★★★★★

Thank you very much for visiting the MST booth at the exhibition "21st Fine Tech Japan," which was held at Tokyo Big Sight from April 13 (Wednesday) to 15 (Friday), 2011. We have published the panels showcasing the analysis cases exhibited at the MST booth as a catalog. If you were unable to attend the exhibition, did not stop by the MST booth, or would like to view the MST exhibition materials again, please take a look. ★Upcoming MST exhibition schedule - October 26 (Wednesday) to 28 (Friday), 2011 GreenDevice 2011 at Pacifico Yokohama - December 5 (Monday) to 7 (Wednesday), 2011 PV Japan 2011 at Makuhari Messe - December 7 (Wednesday) to 9 (Friday), 2011 SEMICON Japan 2011 at Makuhari Messe

MST has registered the panels exhibited at the following three exhibitions last year as a catalog: - SEMICON Japan 2010 - Green Device 2010 - Nature Photonics Technology Conference 2010 For those who were unable to attend the exhibitions, those who could not visit the MST booth, or those who would like to view MST's exhibition materials again, please take a look. You can view them from the "Categories of Products and Services" under "Materials from Exhibitions MST Exhibited." ★★MST will actively participate in exhibitions in 2011 as well★★ 【Upcoming Exhibitions】 - PV EXPO 2011 March 2 (Wednesday) to 4 (Friday), 2011 - JSAP EXPO SPRING 2011 Scientific and Measurement Equipment Exhibition March 24 (Thursday) to 27 (Sunday), 2011 - PV Japan 2011 July 27 (Wednesday) to 29 (Friday), 2011 We look forward to seeing you at the venue.