Notice of the Electron Microscope and FIB Seminar hosted by Hitachi High-Technologies Corporation.
一般財団法人材料科学技術振興財団 MST
The seminar "26th Materials Analysis Tech Forum" hosted by Hitachi High-Technologies Corporation will feature MST (Foundation for the Promotion of Material Science and Technology) as the lecturer. A review of the analysis of lithium-ion secondary batteries will be conducted based on analytical data. We look forward to your participation. ● Date and Venue - Tokyo: June 10, 2011 (Friday) 10:00 AM - 4:50 PM THE GRAND HALL (3rd floor, Shinagawa Grand Central Tower) - Osaka: June 21, 2011 (Tuesday) 1:00 PM - 5:10 PM Senri Life Science Center ● Admission Fee and Application For more details, please visit the Hitachi High-Technologies website. ● Overview of MST Lecturer's Course - Title: Proposal of CryoFIB-TEM Method under Controlled Atmosphere - Application to Lithium-Ion Secondary Battery Analysis - Lecturer: Eguchi Hiroshi, Analysis and Evaluation Department, MST (Foundation for the Promotion of Material Science and Technology)
