Introduction to High-Temperature XRD Analysis - For Accurate Identification of Foreign Components
一般財団法人材料科学技術振興財団 MST
MST has launched a service for XRD measurements at micro locations with a beam diameter of 400μm. While elemental information can be obtained for foreign substances and abnormal areas through EDX and AES analysis, adding crystallinity information through micro location XRD measurements allows for more accurate identification of foreign components. Additionally, we have established an environment to investigate the lattice constants of materials that change crystallinity with heating. MST provides a wide range of crystallinity analysis solutions to support your research and development. ★★★★★★★★★★★★★★★★★★★★ For more detailed information, please visit the link to "MST Homepage Feature: Introduction to High-Temperature XRD Analysis"! ★★★★★★★★★★★★★★★★★★★★
