Introduction of MST's new services (STEM/TEM, SEM, AES, SMM)
一般財団法人材料科学技術振興財団 MST
We would like to introduce the new analysis services that MST started from December 2013 to February 2014. MST combines a wide range of analytical methods to provide new solutions. ● Double Cs collector transmission electron microscope (TEM/STEM) [Started in February 2014] - Structural observation and elemental analysis services at atomic resolution level. ● Ultra-low acceleration scanning electron microscope (SEM) [Started in February 2014] - High-resolution observation services of nano-order surface shapes. ● Latest Auger electron spectrometer (AES) [Started in February 2014] - Elemental analysis services of the top surface with high spatial resolution. ● Scanning microwave microscope (SMM) [Started in December 2013] - Carrier concentration distribution evaluation services in semiconductor devices. For more detailed information, please visit the following URL: http://www.mst.or.jp/special/tech/tech036.html
