Technical Information "Degradation Analysis of Organic EL Devices using MSDM (Mass Spectra Depth Mapping) (C0413)" and two other items have been released.
一般財団法人材料科学技術振興財団 MST
We have published two analysis case studies on the MST website: - Degradation analysis of organic EL devices using MSDM (Mass Spectra Depth Mapping) (C0413) - About MSDM (Mass Spectra Depth Mapping) (B0221) For more details, please visit the MST website. http://www.mst.or.jp/
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By visualizing mass spectra, more accurate analysis is possible.
TOF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry
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