"Introduction to TOF-SIMS Data Analysis Method MSDM" has been published.
一般財団法人材料科学技術振興財団 MST
We have published "Introduction to TOF-SIMS Data Analysis Method MSDM" on the MST website. TOF-SIMS is a technique for structural analysis of sample surfaces. It is particularly sensitive to the surface compared to other analytical instruments, making it suitable for identifying organic contaminants on the very surface. Additionally, using a sputter ion source allows for depth profiling analysis of inorganic and organic materials. The information obtained from depth profiling analysis is vast, but we introduce "MSDM," which enables high-precision analysis by visualizing depth, mass, and spectral intensity information. For more details, please visit the MST website. http://www.mst.or.jp/
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TOF-SIMS is a method for structural analysis of sample surfaces. It is suitable for identifying organic contamination on the very surface due to its sensitivity compared to other analytical devices. Additionally, using a sputter ion source allows for depth profiling of inorganic and organic material distribution. The information obtained from depth profiling is vast, but we will introduce "MSDM," which enables highly accurate analysis by visualizing depth, mass, and spectral intensity information.