一般財団法人材料科学技術振興財団 MST Official site

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Technical information "Evaluation of Cu surface discoloration using AES (C0451)" and 4 other items published.

一般財団法人材料科学技術振興財団 MST

一般財団法人材料科学技術振興財団 MST

We have published the following four analysis case studies on the MST website: - TDS analysis of glass samples (C0378) - Evaluation of carrier concentration distribution in Si-IGBT chips (C0443) - Evaluation of discoloration on Cu surfaces using AES (C0451) - Analysis of generated gases using EGA-MS method (B0229) For more details, please visit the MST website. http://www.mst.or.jp/

Related Links

TDS Analysis of Glass Samples (C0378)
Temperature-programmed desorption gas analysis is possible even for transparent samples that allow infrared transmission.
Carrier Concentration Distribution Evaluation of Si-IGBT Chips (C0443)
SRA evaluation of the field stop layer and lifetime killer.
Evaluation of Cu Surface Discoloration by AES (C0451)
Elemental analysis with shallow detection depth is possible while performing SEM observation.
Gas Generation Analysis by EGA-MS Method (B0229)
GC/MS: Gas Chromatography-Mass Spectrometry.
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