X-ray thickness gauge (XY axis scan) SX-1100B
X-ray thickness gauge (XY axis scan) SX-1100B
It is possible to measure the thickness of a single leaf sample across its entire surface. This is a thickness gauge (film thickness gauge) that utilizes soft X-rays. It measures the thickness and density (basis weight) of sheet or plate-like objects non-contact (using soft X-rays). Instead of directly measuring the thickness, it calculates the thickness and density (basis weight) by comparing with a reference material. Unlike X-ray thickness gauges that estimate thickness through transmission attenuation, this method measures the attenuation that occurs while passing through the air layer - sample - air layer. The attenuation caused by the sample is significantly greater than that of air, and the effects of transport only manifest as changes in the thickness of the air layer, making the impact minimal. Therefore, it can achieve high precision measurements. □■□ For more details, please request documentation or download the catalog □■□
basic information
Price information
-
Delivery Time
Model number/Brand name
SX-1100B
Applications/Examples of results
【Usage】 ● Battery electrodes ● Ceramics (sheets, wafers)
