Fallen dust counter for investigating attached debris, foreign objects, and fallen dust.

A special measuring device that can measure falling dust instead of suspended dust! It classifies and counts falling dust particles larger than 10μm.

What is a falling dust counter? A falling dust counter is a device that measures the amount of dust and foreign substances (falling dust) that adhere to the surface of products. By measuring not only the tiny particles suspended in the air but also the coarse particles (10μm to 100μm) that adhere to products and cause defects, it is possible to identify foreign substances that lead to defects and implement countermeasures. Features of the falling dust counter: ■ Coarse particle measurement: Measures coarse particles (falling dust) that are 10μm or larger, which cannot be measured by conventional particle counters. ■ Classification function: Classifies falling dust by size and displays the count. Helps understand the size of dust and foreign substances, contributing to cause identification. ■ Rapid measurement: Measurement time is speedy, approximately within 40 to 50 seconds. ■ ISO14644-17 compliant: Complies with ISO14644-17, established in February 2021. It can serve as a direct management indicator for coarse particles that cause defects. For quality improvement and yield enhancement, please consider introducing a falling dust counter.

Fallen dust counter for the investigation of foreign substances and fallen dust.

basic information

The falling dust counter samples with silicon wafers and is a measurement device specialized in the classification and counting of falling dust particles ranging from 10μm to 100μm. 【Specifications】 ■ Minimum measurable particle size: 10μm ■ Particle size classification: 10μm, 30μm, 50μm, and values can be set arbitrarily within the range of 11μm to 99μm *1) ■ Compatible wafer sizes: 4 inches, 2 inches *2) ■ Maximum measurement area: φ80m, φ30mm ■ Trimming function: Yes ■ Display switching: Yes (classification display available) *1) The thresholds set for arbitrary classifications are values derived from the calibration curve and do not guarantee counting efficiency. *2) Counting efficiency is guaranteed only for the 4-inch area; it is not guaranteed for the 2-inch area, which is limited in size. *Note: Foreign substances such as hair larger than 100μm are unsuitable for sampling with silicon wafers due to their shape and weight, so for investigating larger sizes of dust and foreign substances, the 'Dusker 100 BLACK' is recommended.

Price range

Please contact us for details

Delivery Time

Please contact us for details

Model number/Brand name

NCC Corporation

Applications/Examples of results

We will respond to such concerns! ◯ Despite managing in a class 1,000 cleanroom, foreign material adhesion does not decrease. ◯ Even with particle counters, there is no correlation with defects. ◯ Struggling to reduce the transfer of contaminants from clothing and other items. ◯ Want to investigate the adhesion of debris during transport on ovens and conveyors. ◯ Want to check if ionizers are preventing the adhesion of dust.

Line up（1）

Model number	overview
DTSP10-03	Why not measure the dust in your work environment with a falling dust counter? By measuring large particles, you can help identify and address the causes of defects on site.