Measurement of waste and foreign substances (falling dust) that cause product defects - 'Falling Dust Measurement Service'

Attention those troubled by garbage and foreign object defects! You can easily measure garbage and foreign objects known as coarse particles that can lead to product defects!

What is the Falling Dust Measurement Service? The Falling Dust Measurement Service is a simple measurement service that uses a "Falling Dust Counter" to measure coarse particles, known as falling dust, ranging from 10μm to 100μm that adhere to products and cause defects. Many of the particles that cause defects due to dust and foreign matter are falling dust, which has the characteristic of falling and accumulating very slowly. By using the falling dust measurement device, the "Falling Dust Counter," to classify and count the coarse particles referred to as dust and foreign matter that have fallen, we can measure the dust and foreign matter present on-site, which helps in investigating and addressing the causes of defects. *If you would like to know more about the Falling Dust Counter, please search for "NCC Falling Dust Counter." Recommended for: - Those who want to check the extent of dust and foreign matter (falling dust) accumulating in the production environment. - Those who want to regularly manage and understand "coarse particles" that could cause dust and foreign matter in the size range of 10 to 100μm. - Those who do not have the budget to purchase or rent a Falling Dust Counter. - Those who cannot prepare a clean environment to install a Falling Dust Counter.

Easily measure large particles, referred to as waste or foreign substances (falling dust), that cause product defects! "Falling Dust Measurement Service"

basic information

【Request Procedure】 1. Please contact us through our website or Ipros. 2. After your inquiry, we will submit a quotation for your review. 3. If there are no discrepancies in the details, we will formally accept your request and ship the samples for dust deposition measurement. 4. Install the samples in the environment you wish to measure and expose them for a certain period. 5. After returning the exposed samples to NCC, we will conduct the measurements. 6. Once the measurements are complete, we will prepare a report to be provided to you and notify you of the results. * The report will be available approximately one week after the samples arrive. 【Component Analysis (Optional)】 The component analysis service analyzes the composition of a single foreign particle attached during the dust deposition measurement service. This allows us to understand the physical properties of the foreign particle and identify its material origin, leading to the quickest route for identifying the cause of the foreign matter and resolving defects. Specifically, we will compare the detected foreign particles with our library data (46,000 entries) to identify their components. In some cases, we can even identify specific product names for items like fiber debris. Measurement Conditions: Component analysis targets debris or foreign matter larger than 30μm. The number of dust particles in the dust deposition measurement should be 100 or fewer, with no more than 100 particles larger than 10μm.

Price information

■Reference price: 21,000 yen (since it is conducted with 3 or more samples, the cost is 7,000 yen per silicon wafer) ■Option "Component Analysis": 44,000 yen per particle

Price range

Delivery Time

OTHER

Applications/Examples of results

【Sample Exposure Guidelines】 ■General Environment: 3 hours ■Clean Room Class 10000: 6 hours ■Clean Room Class 1000: 12 hours *If component analysis is desired, we recommend approximately half of the guideline time.