[Image Processing Inspection Case] Mapping Inspection of Wafer Ingot
Example of mapping processing! Obtaining the area of each mapping area from the difference area.
We would like to introduce a case of "mapping inspection of wafer ingots" conducted by our company. This process involves dividing the detected area into vertical and horizontal cells and calculating the area within each divided region. This processing is created to gather data on the extent and location of defects, such as cracks and breaks, in the wafer ingot through mapping. You can view an image of the mapping process in the downloadable materials. [Case Overview] ■ Generate mapping areas ■ Virtual defects ■ Synthesize mapping areas and defects ■ Obtain the area of each mapping area from the differential area *For more details, please download the PDF or feel free to contact us.
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Nomura Unison Co., Ltd. is a company engaged in the design and manufacturing of LCD and semiconductor-related equipment. Located almost in the center of the Japanese archipelago, in the beautiful and rich environment of Suwa, Nagano Prefecture, the company was founded in 1954 as Nomura Industries Co., Ltd. Since then, it has established SN Seiki Co., Ltd., Nanshin Kiko Co., Ltd., and overseas, it has set up Nomura Taiwan Co., Ltd. in Taiwan, responding to societal changes and customer needs. On the occasion of its 50th anniversary, Nomura Industries Co., Ltd. and SN Seiki Co., Ltd. merged, and the company name was changed to "Nomura Unison Co., Ltd." to mark a new beginning. In this ever-changing era, please look forward to the Nomura Unison Group as it strives for harmony with society, the region, people, and the environment, and challenges the future with its unique technology.