We are pleased to announce that Ofuna Corporation Japan has started handling the circuit inspection device "CIRCUIT AOI 4.0." The "CIRCUIT AOI 4.0" is a circuit inspection device with a measurement capacity approximately five times greater than that of conventional equipment. It detects defects such as open circuits, shorts, unevenness, scratches, pinholes, copper residue, line width errors, pad dimension errors, SMT dimension errors, and drill hole errors on substrates. By using multiple LED light sources, it captures optimal images from various angles and measures different substrate materials. *For more details, please contact us.*

Thanks to everyone, we have successfully concluded the publication of the "JPCA SHOW 2020 Special Edition"! Thank you to all who subscribed. The technical information featured in the "JPCA SHOW 2020 Special Edition" will continue to be published under the new name "Technical Introduction," so we would be grateful if you could download the materials and take a look. Additionally, we will be updating the technical materials in the "Technical Introduction" periodically, so please be sure to check it out.