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VT-STM/AFM (Variable Temperature Scanning Tunneling Microscope)
This is an introduction to a scanning tunneling microscope equipped with a cooling and heating system.
VT-STM/AFM (Variable Temperature Scanning Tunneling Microscope) refers to a scanning tunneling microscope equipped with a cooling and heating system. It enables STM measurements across a wide temperature range from low to high temperatures, making it suitable for STM observation and measurement in the nano domain (from low to high temperatures). *For more details, please contact us or download the PDF document.*
basic information
For more details, please contact us or download the PDF document.
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Applications/Examples of results
STM observation and measurement in the nano region from low temperature to high temperature.
