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ARPES-Lab (Angle-Resolved Photoemission Spectroscopy Analysis System)
Introduction of a next-generation ARPES measurement device for XPS observation and measurement with angle-resolved ARPES!
The ARPES-Lab (ARPES photoelectron spectroscopy analysis system) is a device used for XPS observation and measurement. 【Purpose】 XPS observation and measurement using ARPES --- Below is an introduction in English. The ARPES-Lab brings together the world leading instrumentation for ARPES: ●Outstanding performance ARPES system with unchallenged energy and angular resolution ●Intelligent integration and automation ●Revolutionary DA30 deflection mode operation: - Improved ky accuracy - Matrix element effects are avoided by keeping the sample fixed - Ensures the same sample point for all k// *For more details, please contact us or download the PDF materials.
basic information
●Detectors for spin-resolved measurements available ●Options for 4, 5, or 6 axis cryo-cooled manipulators ●Highest flux monochromated lab UV source for fast measurements ●True UHV during operation for long sample lifetime ●Tailored UHV system for high-performance ARPES ●Flexible system design for future upgrades and extensions ※For more details, please contact us.
Price range
Delivery Time
Applications/Examples of results
XPS observation and measurement using ARPES *For details, please contact us.
