Leave surface analysis to us for basic researchers!
Photoelectron spectroscopy-related devices - Introducing an outstanding range of products such as scanning tunneling microscopes (STM) and atomic force microscopes (AFM) utilizing ultra-high vacuum technology!
Since the dawn of photoelectron spectroscopy (PES), we have focused on its importance and developed many related devices as a top global brand, introducing them to the market. Additionally, we continue to provide an outstanding range of products, including scanning tunneling microscopes (STM) and atomic force microscopes (AFM) that utilize ultra-high vacuum technology. [Featured Products *Partial List] 1) HAXPES Lab Laboratory-type hard X-ray photoelectron spectroscopy analysis system (Hard X-ray photoelectron spectroscopy, previously only possible at synchrotron facilities, is now available in the lab!) 2) HiPP Lab Environmentally controlled X-ray photoelectron spectroscopy analysis system (XPS analysis device that enables measurements at atmospheric pressure levels) 3) ARPES Device used for XPS observation and measurement 4) MBE Systems Vacuum deposition equipment 5) STM/AFM Scanning tunneling microscope equipped with cooling and heating systems *For more details, please contact us or download the PDF.
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XPS observation and measurement of samples in deeper areas than the surface. *For more details, please contact us.*
