Particle Characteristic Evaluation Device LS Spectrometer
Reduce the effects of multiple scattering! A particle characterization device that allows measurement in the sample's original state.
The "LS Spectrometer" from Japan Quantum Design is a sophisticated particle characterization device based on SLS and DLS. To eliminate the contribution of multiple scattering to the data, it employs innovative 3D cross-correlation technology, which means there is no need to dilute the sample. It allows for the measurement of particle size, shape and structure factors, molecular weight, rotational and translational diffusion coefficients while maintaining the sample in its original state. 【Features】 ■ Particle characterization device based on SLS and DLS ■ No need to dilute the sample ■ Measurement possible in the sample's original state ■ Effective in reducing the effects of multiple scattering *For more details, please refer to the PDF document or feel free to contact us.
basic information
【Specifications】 ■Standard Measurement Mode - Particle size measurement: 0.15nm to 5μm (turning radius, hydrodynamic radius) - Particle size distribution - Polydispersity measurement - Diffusion coefficient - Mean squared displacement - Molecular weight - Second virial coefficient - Rayleigh ratio - Shape and structure factor - Internal particle spacing - Process monitoring (gelation, aggregation, aging, etc.) ■Scattering angle: 12°-155° *For more details, please refer to the PDF document or feel free to contact us.
Price information
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Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
