Compact Type Atomic Force Microscope NaioAFM
Introducing a low-cost "All-in-one" AFM device that is compact, durable, and easy to operate!
"NaioAFM" is a compact atomic force microscope suitable for users who want to measure surface shapes concisely and quickly in the fields of nanotechnology education at universities and vocational schools, as well as in research and development or quality control. With the product's unique "Flip-over" scan head and dedicated exchange tools, it allows for quick and simple cantilever replacement. Balancing functionality and operability, it is an "All-in-one" AFM device that can be used by anyone, anywhere, and is widely utilized around the world. 【Features】 ■ Integrated controller, XY stage, wind shield, and vibration isolation mechanism ■ Equipped with a high-resolution top-view optical camera for positioning and side-view observation ■ Additional measurement modes can be added according to needs ■ Simple cantilever replacement: no need to adjust the laser or detector ■ Ready for measurement immediately after installation: just connect the USB cable and launch the software *For more details, please refer to the PDF document or feel free to contact us.
basic information
【Specifications (Excerpt)】 ■ Usable sample size: within 12mm square / up to 3.5mm in height ■ Sample stage movement range: 12mm in the plane ■ Approach: 4mm linear motor, continuous or step-type approach ■ Imaging modes: Static Force, Dynamic Force, Phase Contrast, MFM, EFM Supports various other measurement modes ■ Power consumption: 100-240VAC, 50/60Hz, 50W * For more details, please refer to the PDF document or feel free to contact us.
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Applications/Examples of results
【Purpose】 ■ Education in nanotechnology at universities and vocational schools, as well as in research and development or quality control settings. *For more details, please refer to the PDF document or feel free to contact us.
