[Proposal for the Semiconductor Field] Surface Inspection Equipment and Resist
We will propose solutions in the semiconductor field, which we specialize in, tailored to our customers' needs!
In addition to our expertise in nano-order surface analysis equipment, we also propose resist solutions and maskless exposure devices for semiconductor processes.
basic information
【Surface Inspection】 ◆Atomic Force Scanning Electron Microscope (AFM & SEM in situ measurement) by Quantum Design North America ◇Atomic Force Microscope (AFM) by Nanosurf ◆Scattering-type Near-field Optical Infrared Microscope (Nano-FTIR) by attocube ◇One-shot 3D measurement device by Lyncee tec 【For Semiconductor Processes】 ◆Maskless Exposure Device by DMO ◇Resist by Allresist
Price range
Delivery Time
Applications/Examples of results
◆Semiconductor wafer surface inspection ◇Semiconductor manufacturing process If you have any questions or inquiries, please feel free to contact us.
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