NI (National Instruments) "5G Test Solution"

Accelerating the testing of 5G devices. Capable of building a highly reliable testing environment for millimeter wave frequency tests and OTA tests.

With the full-scale launch of communication services utilizing 5G, the development of 5G-compatible devices requires conducting a large number of tests in a short period of time. Our company offers NI's "5G Test Solutions," contributing to the establishment of a high-efficiency and high-reliability testing environment. [Examples of Solutions] ■ "5G mmWave Test System" Combining signal transmission and reception modules compatible with millimeter waves and switches, we build test systems tailored to your needs. It enables high-speed generation and analysis of 5G signals. ■ "OTA Validation Reference System" A test system that leverages the high-speed bus of PXI to accelerate OTA testing. We have a track record of completing tests approximately six times faster than before. ■ Utilization of Developed Software We offer a variety of pre-developed measurement and control software, as well as data analysis software. This significantly shortens the development period for the testing environment. ■ Hardware We provide customizable platform-based test solutions from the PXI series. This allows for smooth integration of multiple testing equipment environments, making it easy to test complex 5G environments.

basic information

To achieve the key performance indicators of mobile broadband enhanced by 5G, the semiconductor devices of the 5G infrastructure need to enhance reliable MU-MIMO capabilities at millimeter wave frequencies with wider channel bandwidth. Additionally, 5G base stations incorporate beamforming systems equipped with dozens or hundreds of antennas, enabling spatial multiplexing by targeting individual receivers. At the same time, millimeter wave 5G user equipment (UE) relies on beamforming to focus the uplink signal towards the base station. Whether these blocks remain as individual elements of the 5G infrastructure system or as integrated AiP chips for the UE, new challenges arise in their testing. National Instruments' testing solutions will support you by testing more devices in a shorter time and obtaining reliable results.