サンケイエンジニアリング 本社 Official site

Exhibition Participation | Can't Measure? Can't Create? Technical Consultation Center for Electrical Measurement and Processing Technology

Whether it's concerns about electrical measurements or issues with component processing, please consult us. We will be exhibiting at the Ipros AI Industry World on December 9-10 [demonstrations will also be conducted].

"Can't measure accurately?" "There are no places to create?" Do you have such concerns? We will be exhibiting a "Technical Consultation Center" for electrical measurement and processing technology at "Iprosu AI Industry World 2026" on December 9th and 10th.

Related Link - https://expo.ipros.jp/event/17312/module/booth/468…

basic information

■What you can see at the booth 1. Contact resistance measurement demo: Actual measurement of contact resistance by changing probes and workpieces 2. High current conduction demo: Visualization of heat generation during conduction using a thermal camera 3. Probe physical display: From catalog items to special products 4. Consultation on parts processing: You can discuss processing methods and feasibility based on drawings ■Exhibition Overview Exhibition Name: Ipros AI Industry World 2026 Dates: December 9 (Wednesday) and 10 (Thursday), 2026 [Opening hours] Venue: Tokyo International Forum Booth Number: 7-5

Price range

Delivery Time

Applications/Examples of results

Substrate inspection, continuity testing of connectors and wire harnesses, battery charge and discharge testing, power device conduction testing, etc.

Comprehensive Catalog Table of Contents

CATALOG

Problem-solving! The 119 for electrical measurements.

TECHNICAL

Recommended products

Distributors

Contact probes are indispensable for the manufacturing of all precision instruments. Since entering this field 50 years ago, Sankei Engineering has actively worked on "technologies and products that cannot be imitated by other companies," accumulating unique know-how. Particularly in specialized areas that require high precision, such as measurements under high current, high voltage, and extreme temperatures, it is difficult to meet the demands without our outer spring type (integrated) contact probes, establishing a significant competitive advantage in this market.