光学特性検査システム
光学特性検査システム
当社製品を組合わせて光学特性を測定するコンプリートシステムの提供も行っております。 昨今、測定の高速化や高精度化が求められていますが、お客様のご要望に合わせシステム化を行いますのでお気軽にご相談ください。
1～7 item / All 7 items
-
Optical Characteristic Inspection System "Swept Test System"
High-speed, high-precision, and high-resolution evaluation of IL/WDL/PDL is possible!
last updated
-
Optical Coherence Tomography (High-Speed Type) 'IVS-2000-HS'
Even in a scattered medium, light can penetrate easily, making it suitable for measuring objects with strong scattering!
last updated
-
Optical Coherence Tomography Device 'IVS-2000-LC'
It is possible to perform 3D measurements of objects with varying heights all at once!
last updated
-
Optical Coherence Tomography (High Resolution Type) 'IVS-2000-HR'
Even in a scattered medium, light can penetrate easily, making it suitable for measuring strongly scattering objects!
last updated
-
Wafer Thickness Distribution Measurement Device "TMS-2000"
Non-contact measurement of flatness with a repeatability of 1nm is possible!
last updated
-
Optical 3D Measuring Instrument "OPS-1000"
An ultra-sensitive model with over 100 times the minimum light reception sensitivity compared to conventional methods!
last updated
-
Special feature on optimal solutions for the characteristic evaluation of optoelectronic fusion devices.
Evaluation solution to accelerate SiPh/PIC development.
last updated