Nano surface roughness and shape measuring instrument Nano Seven
Easy operation, non-contact, rapid, high resolution, low-cost nano surface roughness and step shape measurement device. No vibration isolation table is required, making it possible for full inspection on the production line.
A compact surface roughness and shape measurement system that utilizes optical heterodyne interferometry, providing vibration resistance and high precision measurements with a height resolution of 0.1 nanometers. Measurement time can be significantly reduced, and it allows for full inspection on the production line without the need for an anti-vibration table. It is capable of extensive measurements and can be applied to multi-point measurements and large samples. <Main Features> 1) Significant reduction in measurement time at a low cost 2) High resolution with a height direction of 0.1 nanometers, maintaining compatibility with AFM 3) Simple measurements without the need for sample pre-treatment or vacuum, eliminating the need for an anti-vibration table 4) Capability for extensive measurements 5) External vibrations are canceled out through optical heterodyne interferometry, etc.
basic information
Measurement method: Optical heterodyne interferometry Height resolution: 0.1 nm Reference height measurement range: 0.5 to 300 nm Reference measurement range: X-axis 45 mm, Y-axis 45 mm Roughness Ra: 0.1 to 50 nm, step height 1 to 150 nm Scratches, shapes, etc. Main unit dimensions: W 313 x D 614 x H 428 mm, weight 27 kg
Price range
P6
Delivery Time
OTHER
2-3 months
Model number/Brand name
Nano Seven TN-A1
Applications/Examples of results
Electronics, semiconductors, automobiles, microtechnology, film, precision engineering, medical field, data storage, ceramics...
