High-Speed Pulse I-L Test System SEC-PL4000-800
High reproducibility and stability
This is a device for measuring I-L and I-Vf characteristics by driving a laser diode with high-speed pulsed operation.
basic information
【Features】 ● The kink characteristics of I-L in pulse modulation, which cannot be obtained with CW, can be measured in the short pulse width range of 30nS. ● The obtained data is displayed and processed on WINDOWS. ● Measurements such as beam profiling, polarization characteristics, and FFP are possible due to the customization of the measurement stage. ● High expandability (additional measurement heads can be added). ● For other functions and details, please refer to the catalog.
Price information
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Applications/Examples of results
【Purpose】 ○ Evaluation device for LD acceptance inspection in pickup development ○ Curve tracer for quality inspection ○ Reference instrument for power calibration
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We, System Giken Co., Ltd., are a research and development-oriented company with nearly 50 members, and under our consistent user-first (customer-first) corporate philosophy, we continuously strive for creativity and technological innovation to meet various customer requests. Since our establishment in 1969, we have contributed to the advancement of cutting-edge technology through measurement and evaluation systems for advanced devices. In recent years, we take pride in being highly regarded as a pioneer in measurement and evaluation systems for devices in the optoelectronics field. We sincerely ask for your continued support and encouragement, as we aspire to be a System Giken that meets the expectations of even more people.