VCSEL Winter Chip/Array/Wafer Tester
Equipped with a CCD camera!
A semi-automatic device for probing contact on a heater stage to measure the I-L characteristics of a wafer-to-chip vertical-cavity surface-emitting laser (VCSEL-LD).
basic information
【Features】 ● The stage consists of four axes: X-axis, Y-axis, θ-axis, and Z-axis, enabling precise positioning with a stepping motor. ● The installation of a CCD camera allows for comfortable positioning on the monitor. ● The stage features a vacuum suction table, making implementation easy. ● For other functions and details, please refer to the catalog.
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We, System Giken Co., Ltd., are a research and development-oriented company with nearly 50 members, and under our consistent user-first (customer-first) corporate philosophy, we continuously strive for creativity and technological innovation to meet various customer requests. Since our establishment in 1969, we have contributed to the advancement of cutting-edge technology through measurement and evaluation systems for advanced devices. In recent years, we take pride in being highly regarded as a pioneer in measurement and evaluation systems for devices in the optoelectronics field. We sincerely ask for your continued support and encouragement, as we aspire to be a System Giken that meets the expectations of even more people.