ARL EQUINOX 100 X-ray diffractometer (XRD)
An X-ray diffraction device (XRD) equipped with a unique CPS detector that can simultaneously acquire the full diffraction pattern in real time.
The tabletop ARL EQUINOX 100 X-ray diffractometer is a compact tabletop model that enables rapid analysis, in situ experiments, and analysis of crystal phase formation and transitions in materials research and development, dynamic behavior analysis, routine analysis for QA/QC in the pharmaceutical industry, and educational institutions such as universities. The ARL EQUINOX 100 is equipped with a unique CPSCPS (Curved Position Sensitive) detector, allowing for the simultaneous measurement of the entire diffraction pattern (up to 110°/2θ) in a short time. It also supports thin film measurements (GIXRD, XRR) and offers a variety of attachments depending on the measurement requirements.
basic information
[X-ray Source] Output: 60 W (60 kV/1 mA) Options: 30 kV/1 mA Micro-focus X-ray source (Cu, 50 W/Co, 15 W/Mo, 50 W) [Detector] CPS (Curved Position Sensitive) detector, CPS180 model Gas detector: Argon/Ethane (85/15) Real-time measurement range: 110°2θ Radius of curvature: 180 mm Minimum recordable angle: approximately 1°2θ [Goniometer] Fixed goniometer: no moving parts Acquisition angle: 0–110°2θ Measured in asymmetric mode [Software] Drive and data measurement Real-time display of diffractograms Multiple and automatic recording Peak search Deconvolution: multiple profile functions Crystallinity, cell parameters, microcrystal size, Lattice strain Phase identification and quantification Crystal structure analysis Phase transition Thin films (GIXRD, reflectivity measurement) Rietveld analysis Weight: approximately 85 kg Dimensions: Height 545 mm × Depth 580 mm × Width 680 mm
Price information
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Delivery Time
Applications/Examples of results
Thin Film Analysis Dynamic Behavior Analysis Pharmaceuticals Environment Geology Mining Education etc.
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