Hamamatsu Photonics PHEMOS-X
Equipped with a multi-wavelength laser, it can handle everything from visible light to near-infrared light with a single device.
PHEMOS-X is a high-resolution emission microscope that captures light emission and heat generation caused by semiconductor device failures to identify the failure location. 1. Capable of mounting up to two ultra-high sensitivity cameras. 2. Can accommodate up to seven light sources for OBIRCH, DALS, EOP, and laser markers. 3. Equipped with an optical stage compatible with various samples.
basic information
By covering different detection ranges such as luminescence analysis and heat generation analysis, or visible light and near-infrared light, you can select analysis techniques tailored to the sample or failure mode.
Price range
P9
Delivery Time
OTHER
Applications/Examples of results
It is used for the analysis of semiconductors.
